Robert Haefner

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Apalachin, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for emitter detection
- Patent number 8,170,135
- Issue date May 1, 2012
- Lockheed Martin Corporation
- Craig A. Hanna
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and apparatus for emitter detection
- Publication number 20080219322
- Publication date Sep 11, 2008
- Lockheed Martin Corporation
- Craig A. Hanna
- G01 - MEASURING TESTING