Robert Haynes

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-column scanning electron microscopy system
- Patent number 10,840,056
- Issue date Nov 17, 2020
- KLA Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column spacing for photomask and reticle inspection and wafer...
- Patent number 10,777,377
- Issue date Sep 15, 2020
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array-based characterization tool
- Patent number 10,438,769
- Issue date Oct 8, 2019
- KLA-Tencor Corporation
- Alex Lipkind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-column scanning electron microscopy system
- Patent number 10,354,832
- Issue date Jul 16, 2019
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer ceramic vacuum to atmosphere electric feed through
- Patent number 9,591,770
- Issue date Mar 7, 2017
- KLA-Tencor Corporation
- Robert Haynes
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for optical inspection, magnetic field and hei...
- Patent number 9,513,230
- Issue date Dec 6, 2016
- KLA-Tencor Corporation
- John Gerling
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Background reduction system including louver
- Patent number 8,633,457
- Issue date Jan 21, 2014
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for forming an electrical conduction path thr...
- Patent number 8,618,513
- Issue date Dec 31, 2013
- KLA-Tencor Corporation
- Tomas Plettner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-planar extractor structure for electron source
- Patent number 8,513,619
- Issue date Aug 20, 2013
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple-column electron beam apparatus and methods
- Patent number 8,455,838
- Issue date Jun 4, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle energy analyzer
- Patent number 8,421,030
- Issue date Apr 16, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM
- Publication number 20210090844
- Publication date Mar 25, 2021
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Column Scanning Electron Microscopy System
- Publication number 20180358200
- Publication date Dec 13, 2018
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Column Spacing for Photomask and Reticle Inspection and Wafer...
- Publication number 20180233318
- Publication date Aug 16, 2018
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Column Scanning Electron Microscopy System
- Publication number 20180226219
- Publication date Aug 9, 2018
- KLA-Tencor Corporation
- Robert Haynes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-LAYER CERAMIC VACUUM TO ATMOSPHERE ELECTRIC FEED THROUGH
- Publication number 20140318855
- Publication date Oct 30, 2014
- KLA-Tencor Corporation
- Robert Haynes
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS AND METHOD FOR OPTICAL INSPECTION, MAGNETIC FIELD AND HEI...
- Publication number 20140218503
- Publication date Aug 7, 2014
- KLA-Tencor Corporation
- John Gerling
- G01 - MEASURING TESTING
Information Patent Application
BACKGROUND REDUCTION SYSTEM INCLUDING LOUVER
- Publication number 20130001417
- Publication date Jan 3, 2013
- KLA-Tencor Corporation
- Mehran Nasser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHODS FOR FORMING AN ELECTRICAL CONDUCTION PATH THR...
- Publication number 20120298879
- Publication date Nov 29, 2012
- Tomas PLETTNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS

Robert Haynes

Person

Patents Grantslast 30 patents

Multi-column scanning electron microscopy system

Multi-column spacing for photomask and reticle inspection and wafer...

Array-based characterization tool

Multi-column scanning electron microscopy system

Multi-layer ceramic vacuum to atmosphere electric feed through

Apparatus and method for optical inspection, magnetic field and hei...

Background reduction system including louver

Apparatus and methods for forming an electrical conduction path thr...

Non-planar extractor structure for electron source

Multiple-column electron beam apparatus and methods

Charged-particle energy analyzer

Patents Applicationslast 30 patents

MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM

Multi-Column Scanning Electron Microscopy System

Multi-Column Spacing for Photomask and Reticle Inspection and Wafer...

Multi-Column Scanning Electron Microscopy System

MULTI-LAYER CERAMIC VACUUM TO ATMOSPHERE ELECTRIC FEED THROUGH

APPARATUS AND METHOD FOR OPTICAL INSPECTION, MAGNETIC FIELD AND HEI...

BACKGROUND REDUCTION SYSTEM INCLUDING LOUVER

APPARATUS AND METHODS FOR FORMING AN ELECTRICAL CONDUCTION PATH THR...

CHARGED-PARTICLE ENERGY ANALYZER