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Robert J. Hatfield
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus employing external light source for endpoint d...
Patent number
6,509,960
Issue date
Jan 21, 2003
Micron Technology, Inc.
David R. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus employing external light source for endpoint d...
Patent number
6,429,928
Issue date
Aug 6, 2002
Micron Technology, Inc.
David R. Johnson
G01 - MEASURING TESTING
Information
Patent Grant
Automated light tuner
Patent number
6,179,448
Issue date
Jan 30, 2001
Micron Technology, Inc.
David R. Johnson
G02 - OPTICS
Information
Patent Grant
Method and apparatus employing external light source for endpoint d...
Patent number
5,969,805
Issue date
Oct 19, 1999
Micron Technology, Inc.
David R. Johnson
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS EMPLOYING EXTERNAL LIGHT SOURCE FOR ENDPOINT D...
Publication number
20010046043
Publication date
Nov 29, 2001
DAVID R. JOHNSON
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus employing external light source for endpoint d...
Publication number
20010009459
Publication date
Jul 26, 2001
David R. Johnson
G01 - MEASURING TESTING