Robert J. Hillard

Person

Avalon, PA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Elastic metal gate MOS transistor for surface mobility measurement...
- Patent number 7,327,155
- Issue date Feb 5, 2008
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically determining electrical properti...
- Patent number 7,295,022
- Issue date Nov 13, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining generation lifetime of product...
- Patent number 7,037,734
- Issue date May 2, 2006
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Work function controlled probe for measuring properties of a semico...
- Patent number 7,023,231
- Issue date Apr 4, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting soft breakdown of a dielectric l...
- Patent number 7,005,307
- Issue date Feb 28, 2006
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method of electrical characterization of a silicon-on-insulator (SO...
- Patent number 6,991,948
- Issue date Jan 31, 2006
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Conductance-voltage (GV) based method for determining leakage curre...
- Patent number 6,879,176
- Issue date Apr 12, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining one or more properties of a semiconductor wafer
- Patent number 6,741,093
- Issue date May 25, 2004
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Grant
Non-invasive electrical measurement of semiconductor wafers
- Patent number 6,492,827
- Issue date Dec 10, 2002
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact capacitance measuring device
- Patent number 6,150,832
- Issue date Nov 21, 2000
- Solid State Measurements, Inc.
- Robert G. Mazur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for non-invasive measurement of electrical pro...
- Patent number 5,023,561
- Issue date Jun 11, 1991
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of destructive testing the dielectric layer of a semiconduct...
- Publication number 20080290889
- Publication date Nov 27, 2008
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method for determining the electrically active dopant density profi...
- Publication number 20070249073
- Publication date Oct 25, 2007
- Solid State Measurement, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Elastic metal gate MOS transistor for surface mobility measurement...
- Publication number 20070109007
- Publication date May 17, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method and system for automatically determining electrical properti...
- Publication number 20070046310
- Publication date Mar 1, 2007
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining generation lifetime of product...
- Publication number 20050287683
- Publication date Dec 29, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...
- Publication number 20050287684
- Publication date Dec 29, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Work function controlled probe for measuring properties of a semico...
- Publication number 20050253618
- Publication date Nov 17, 2005
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of testing semiconductor wafers with non-penetrating probes
- Publication number 20050225345
- Publication date Oct 13, 2005
- Solid State Measurements, Inc.
- Robert G. Mazur
- G01 - MEASURING TESTING
Information Patent Application
Method of electrical characterization of a silicon-on-insulator ( S...
- Publication number 20050095728
- Publication date May 5, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTANCE-VOLTAGE (GV) BASED METHOD FOR DETERMINING LEAKAGE CURRE...
- Publication number 20050093563
- Publication date May 5, 2005
- Solid State Measurements, Inc.
- Robert J. Hillard
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting carrier dose of a semiconductor wafer
- Publication number 20040108869
- Publication date Jun 10, 2004
- William H Howland
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting carrier dose of a semiconductor wafer
- Publication number 20020180474
- Publication date Dec 5, 2002
- Soild State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING

Robert J. Hillard

Person

Patents Grantslast 30 patents

Elastic metal gate MOS transistor for surface mobility measurement...

Method and system for automatically determining electrical properti...

Method and apparatus for determining generation lifetime of product...

Work function controlled probe for measuring properties of a semico...

Apparatus and method for detecting soft breakdown of a dielectric l...

Method of electrical characterization of a silicon-on-insulator (SO...

Conductance-voltage (GV) based method for determining leakage curre...

Method of determining one or more properties of a semiconductor wafer

Non-invasive electrical measurement of semiconductor wafers

Noncontact capacitance measuring device

Apparatus and method for non-invasive measurement of electrical pro...

Patents Applicationslast 30 patents

Method of destructive testing the dielectric layer of a semiconduct...

Method for determining the electrically active dopant density profi...

Elastic metal gate MOS transistor for surface mobility measurement...

Method and system for automatically determining electrical properti...

Method and apparatus for determining generation lifetime of product...

APPARATUS AND METHOD FOR DETECTING SOFT BREAKDOWN OF A DIELECTRIC L...

Work function controlled probe for measuring properties of a semico...

Method of testing semiconductor wafers with non-penetrating probes

Method of electrical characterization of a silicon-on-insulator ( S...

CONDUCTANCE-VOLTAGE (GV) BASED METHOD FOR DETERMINING LEAKAGE CURRE...

Method of detecting carrier dose of a semiconductor wafer

Method of detecting carrier dose of a semiconductor wafer