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Robert J. Lyons
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Bostn, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
10,444,189
Issue date
Oct 15, 2019
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
9,772,309
Issue date
Sep 26, 2017
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for non-destructive evaluation of materials
Patent number
8,928,316
Issue date
Jan 6, 2015
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Component adaptive life management
Patent number
8,494,810
Issue date
Jul 23, 2013
Jentek Sensors, Inc.
Neil J. Goldfine
G07 - CHECKING-DEVICES
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
8,237,433
Issue date
Aug 7, 2012
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field characterization of stresses and properties in mater...
Patent number
7,876,094
Issue date
Jan 25, 2011
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Material condition assessment with eddy current sensors
Patent number
7,812,601
Issue date
Oct 12, 2010
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Absolute property measurements using electromagnetic sensors
Patent number
7,696,748
Issue date
Apr 13, 2010
Jentek Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Grant
Applied and residual stress measurements using magnetic field sensors
Patent number
7,526,964
Issue date
May 5, 2009
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Material condition monitoring with multiple sensing modes
Patent number
7,451,657
Issue date
Nov 18, 2008
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Self-monitoring metals, alloys and materials
Patent number
7,188,532
Issue date
Mar 13, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Grant
Hidden feature characterization using a database of sensor responses
Patent number
7,161,351
Issue date
Jan 9, 2007
Jentek Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR NON-DESTRUCTIVE EVALUATION OF MATERIALS
Publication number
20170315095
Publication date
Nov 2, 2017
JENTEK Sensors, Inc.
Neil J Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Non-Destructive Evaluation of Materials
Publication number
20150212044
Publication date
Jul 30, 2015
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR NON-DESTRUCTIVE EVALUATION OF MATERIALS
Publication number
20120126803
Publication date
May 24, 2012
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Field Characterization of Stresses and Properties in Mater...
Publication number
20110163742
Publication date
Jul 7, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Component Adaptive Life Management
Publication number
20110060568
Publication date
Mar 10, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G07 - CHECKING-DEVICES
Information
Patent Application
Component Adaptive Life Management
Publication number
20110054806
Publication date
Mar 3, 2011
JENTEK Sensors, Inc.
Neil J. Goldfine
G07 - CHECKING-DEVICES
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20100045277
Publication date
Feb 25, 2010
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material Condition Assessment with Eddy Current Sensors
Publication number
20100026285
Publication date
Feb 4, 2010
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20070227255
Publication date
Oct 4, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20070114993
Publication date
May 24, 2007
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material condition assessment with eddy current sensors
Publication number
20060244443
Publication date
Nov 2, 2006
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Material condition monitoring with multiple sensing modes
Publication number
20050171703
Publication date
Aug 4, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Absolute property measurements using electromagnetic sensors
Publication number
20050127908
Publication date
Jun 16, 2005
JENTEK Sensors, Inc.
Darrell E. Schlicker
G01 - MEASURING TESTING
Information
Patent Application
Hidden feature characterization using eddy current sensors and arrays
Publication number
20050088172
Publication date
Apr 28, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Self-monitoring metals, alloys and materials
Publication number
20050083032
Publication date
Apr 21, 2005
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field characterization of stresses and properties in mater...
Publication number
20040056654
Publication date
Mar 25, 2004
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING
Information
Patent Application
Applied and residual stress measurements using magnetic field sensors
Publication number
20030173958
Publication date
Sep 18, 2003
JENTEK Sensors, Inc.
Neil J. Goldfine
G01 - MEASURING TESTING