Robert J. Madge

Person

Redwood City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method to selectively identify at risk die based on location within...
- Patent number 7,305,634
- Issue date Dec 4, 2007
- LSI Corporation
- Manu Rehani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modified binary search for optimizing efficiency of data collection...
- Patent number 7,079,963
- Issue date Jul 18, 2006
- LSI Logic Corporation
- Cary Gloor
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Adaptive defect based testing
- Patent number 7,073,107
- Issue date Jul 4, 2006
- LSI Logic Corporation
- Robert Madge
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of detecting spatially correlated variations in a parameter...
- Patent number 6,943,042
- Issue date Sep 13, 2005
- LSI Logic Corporation
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feature targeted inspection
- Patent number 6,931,297
- Issue date Aug 16, 2005
- LSI Logic Corporation
- Robert Madge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Adaptive off tester screening method based on intrinsic die paramet...
- Patent number 6,807,655
- Issue date Oct 19, 2004
- LSI Logic Corporation
- Manu Rehani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting spatially correlated variations in a parameter...
- Patent number 6,787,379
- Issue date Sep 7, 2004
- LSI Logic Corporation
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Statistical decision system
- Patent number 6,782,500
- Issue date Aug 24, 2004
- LSI Logic Corporation
- Robert J. Madge
- G01 - MEASURING TESTING
Information Patent Grant
Feed forward testing
- Patent number 6,682,947
- Issue date Jan 27, 2004
- LSI Logic Corporation
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Grant
Latent defect classification system
- Patent number 6,647,348
- Issue date Nov 11, 2003
- LSI Logic Corporation
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Grant
Die attach back grinding
- Patent number 6,624,048
- Issue date Sep 23, 2003
- LSI Logic Corporation
- Robert Madge
- B24 - GRINDING POLISHING
Information Patent Grant
Parametric device signature
- Patent number 6,601,008
- Issue date Jul 29, 2003
- LSI Logic Corporation
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test limits based on position
- Patent number 6,598,194
- Issue date Jul 22, 2003
- LSI Logic Corporation
- Robert J. Madge
- G01 - MEASURING TESTING
Information Patent Grant
Ratio testing
- Patent number 6,532,431
- Issue date Mar 11, 2003
- LSI Logic Corporation
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Grant
Defect screening using delta VDD
- Patent number 6,476,631
- Issue date Nov 5, 2002
- LSI Logic Corporation
- Robert Madge
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF LOWERING CAPACITANCES OF CONDUCTIVE APERTURES AND AN INTE...
- Publication number 20130154109
- Publication date Jun 20, 2013
- LSI Corporation
- Ramnath Venkatraman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to selectively identify at risk die based on location within...
- Publication number 20060109462
- Publication date May 25, 2006
- Manu Rehani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FEATURE TARGETED INSPECTION
- Publication number 20050197728
- Publication date Sep 8, 2005
- Robert Madge
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for adaptively testing integrated circuits based on parametr...
- Publication number 20040236531
- Publication date Nov 25, 2004
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Application
Modified binary search for optimizing efficiency of data collection...
- Publication number 20040205052
- Publication date Oct 14, 2004
- Cary Gloor
- G05 - CONTROLLING REGULATING
Information Patent Application
Adaptive defect based testing
- Publication number 20040181717
- Publication date Sep 16, 2004
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting spatially correlated variations in a parameter...
- Publication number 20040033635
- Publication date Feb 19, 2004
- Robert Madge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Feed forward testing
- Publication number 20040010763
- Publication date Jan 15, 2004
- Robert Madge
- G01 - MEASURING TESTING
Information Patent Application
Latent defect classification system
- Publication number 20030069706
- Publication date Apr 10, 2003
- Robert Madge
- G01 - MEASURING TESTING

Robert J. Madge

Person

Patents Grantslast 30 patents

Method to selectively identify at risk die based on location within...

Modified binary search for optimizing efficiency of data collection...

Adaptive defect based testing

Method of detecting spatially correlated variations in a parameter...

Feature targeted inspection

Adaptive off tester screening method based on intrinsic die paramet...

Method of detecting spatially correlated variations in a parameter...

Statistical decision system

Feed forward testing

Latent defect classification system

Die attach back grinding

Parametric device signature

Test limits based on position

Ratio testing

Defect screening using delta VDD

Patents Applicationslast 30 patents

METHOD OF LOWERING CAPACITANCES OF CONDUCTIVE APERTURES AND AN INTE...

Method to selectively identify at risk die based on location within...

FEATURE TARGETED INSPECTION

Method for adaptively testing integrated circuits based on parametr...

Modified binary search for optimizing efficiency of data collection...

Adaptive defect based testing

Method of detecting spatially correlated variations in a parameter...

Feed forward testing

Latent defect classification system