Robert J. McMahon

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pre-test power-optimized bin reassignment following selective volta...
- Patent number 10,295,592
- Issue date May 21, 2019
- Global Foundries Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pre-test power-optimized bin reassignment following selective volta...
- Patent number 9,759,767
- Issue date Sep 12, 2017
- GLOBALFOUNDRIES Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...
- Patent number 9,653,330
- Issue date May 16, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to predict chip IDDQ and control leakage components
- Patent number 9,117,045
- Issue date Aug 25, 2015
- International Business Machines Coporation
- Jeanne P. Spence Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Thermally adaptive in-system allocation
- Patent number 8,963,566
- Issue date Feb 24, 2015
- Intenational Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,949,767
- Issue date Feb 3, 2015
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,504,975
- Issue date Aug 6, 2013
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Phase change material based temperature sensor
- Patent number 8,114,686
- Issue date Feb 14, 2012
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation and system fail warning methods using on chi...
- Patent number 8,095,907
- Issue date Jan 10, 2012
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling access to addressable integrated...
- Patent number 7,904,839
- Issue date Mar 8, 2011
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
HDL design structure for integrating test structures into an integr...
- Patent number 7,884,599
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method using distributed phase change elements for acro...
- Patent number 7,882,455
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Grant
Structure for a system for controlling access to addressable integr...
- Patent number 7,831,936
- Issue date Nov 9, 2010
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase change material based temperature sensor
- Patent number 7,795,605
- Issue date Sep 14, 2010
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Grant
Testing method using a scalable parametric measurement macro
- Patent number 7,656,182
- Issue date Feb 2, 2010
- International Business Machines Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of integrating test structures into an integr...
- Patent number 7,653,888
- Issue date Jan 26, 2010
- International Business Machines Corporation
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of acceptance for semiconductor devices
- Patent number 7,560,946
- Issue date Jul 14, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Embedded test circuit for testing integrated circuits at the die level
- Patent number 7,512,915
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Darren Anand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parametric-based semiconductor design
- Patent number 7,487,477
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for acquiring device parameters
- Patent number 7,382,149
- Issue date Jun 3, 2008
- International Business Machines Corporation
- Darren L. Anand
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...
- Publication number 20170276726
- Publication date Sep 28, 2017
- GLOBALFOUNDRIES INC.
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Application
PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...
- Publication number 20160313394
- Publication date Oct 27, 2016
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Application
THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION
- Publication number 20140097860
- Publication date Apr 10, 2014
- International Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20130326442
- Publication date Dec 5, 2013
- Mentor Graphics Corporation
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20120105240
- Publication date May 3, 2012
- International Business Machines Corporation
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHASE CHANGE MATERIAL BASED TEMPERATURE SENSOR
- Publication number 20100254425
- Publication date Oct 7, 2010
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
Circuit And Method Using Distributed Phase Change Elements For Acro...
- Publication number 20090282375
- Publication date Nov 12, 2009
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CU...
- Publication number 20090224792
- Publication date Sep 10, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO PREDICT CHIP IDDQ AND CONTROL LEAKAGE COMPONENTS
- Publication number 20090210201
- Publication date Aug 20, 2009
- Jeanne P. Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design Structure for a System For Controlling Access to Addressable...
- Publication number 20090164961
- Publication date Jun 25, 2009
- International Business Machines Corporation
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Controlling Access to Addressable Integrated...
- Publication number 20090158444
- Publication date Jun 18, 2009
- John R. Goss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...
- Publication number 20090106712
- Publication date Apr 23, 2009
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR AND METHOD OF INTEGRATING TEST STRUCTURES INTO AN INTEGR...
- Publication number 20090083690
- Publication date Mar 26, 2009
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR GENERATING DEVICE MODEL OVERRIDES THROUGH THE USE OF ON-...
- Publication number 20090070722
- Publication date Mar 12, 2009
- Jeanne Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Acceptance for Semiconductor Devices
- Publication number 20090039912
- Publication date Feb 12, 2009
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G01 - MEASURING TESTING
Information Patent Application
PHASE CHANGE MATERIAL BASED TEMPERATURE SENSOR
- Publication number 20090001336
- Publication date Jan 1, 2009
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
System for and Method of Integrating Test Structures into an Integr...
- Publication number 20080270954
- Publication date Oct 30, 2008
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Embedded Test Circuit For Testing Integrated Circuits At The Die Level
- Publication number 20080270951
- Publication date Oct 30, 2008
- Darren Anand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING METHOD USING A SCALABLE PARAMETRIC MEASUREMENT MACRO
- Publication number 20080231307
- Publication date Sep 25, 2008
- Jeanne P. Bickford
- G01 - MEASURING TESTING
Information Patent Application
Method in a Computer-aided Design System for Generating a Functiona...
- Publication number 20080222584
- Publication date Sep 11, 2008
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
HDL Design Structure for Integrating Test Structures into an Integr...
- Publication number 20080189671
- Publication date Aug 7, 2008
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
PARAMETRIC-BASED SEMICONDUCTOR DESIGN
- Publication number 20080148197
- Publication date Jun 19, 2008
- International Business Machines Corporation
- Jeanne Paulette Spence Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A SYSTEM FOR ACQUIRING DEVICE PARAMETERS
- Publication number 20080018356
- Publication date Jan 24, 2008
- Darren L Anand
- G01 - MEASURING TESTING

Robert J. McMahon

Person

Patents Grantslast 30 patents

Pre-test power-optimized bin reassignment following selective volta...

Pre-test power-optimized bin reassignment following selective volta...

Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...

System and method to predict chip IDDQ and control leakage components

Thermally adaptive in-system allocation

Reliability evaluation and system fail warning methods using on chi...

Reliability evaluation and system fail warning methods using on chi...

Phase change material based temperature sensor

Reliability evaluation and system fail warning methods using on chi...

System and method for controlling access to addressable integrated...

HDL design structure for integrating test structures into an integr...

Circuit and method using distributed phase change elements for acro...

Structure for a system for controlling access to addressable integr...

Phase change material based temperature sensor

Testing method using a scalable parametric measurement macro

System for and method of integrating test structures into an integr...

Method of acceptance for semiconductor devices

Embedded test circuit for testing integrated circuits at the die level

Parametric-based semiconductor design

System for acquiring device parameters

Patents Applicationslast 30 patents

PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...

PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...

THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

PHASE CHANGE MATERIAL BASED TEMPERATURE SENSOR

Circuit And Method Using Distributed Phase Change Elements For Acro...

METHOD TO REDUCE TEST PROBE DAMAGE FROM EXCESSIVE DEVICE LEAKAGE CU...

SYSTEM AND METHOD TO PREDICT CHIP IDDQ AND CONTROL LEAKAGE COMPONENTS

Design Structure for a System For Controlling Access to Addressable...

System and Method for Controlling Access to Addressable Integrated...

RELIABILITY EVALUATION AND SYSTEM FAIL WARNING METHODS USING ON CHI...

SYSTEM FOR AND METHOD OF INTEGRATING TEST STRUCTURES INTO AN INTEGR...

METHOD FOR GENERATING DEVICE MODEL OVERRIDES THROUGH THE USE OF ON-...

Method of Acceptance for Semiconductor Devices

PHASE CHANGE MATERIAL BASED TEMPERATURE SENSOR

System for and Method of Integrating Test Structures into an Integr...

Embedded Test Circuit For Testing Integrated Circuits At The Die Level

TESTING METHOD USING A SCALABLE PARAMETRIC MEASUREMENT MACRO

Method in a Computer-aided Design System for Generating a Functiona...

HDL Design Structure for Integrating Test Structures into an Integr...

PARAMETRIC-BASED SEMICONDUCTOR DESIGN

A SYSTEM FOR ACQUIRING DEVICE PARAMETERS