Robert J. Stoner

Person

Duxbury, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interferometry for lateral metrology
- Patent number 9,025,162
- Issue date May 5, 2015
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,948,636
- Issue date May 24, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for lateral metrology
- Patent number 7,889,355
- Issue date Feb 15, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,684,049
- Issue date Mar 23, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,466,429
- Issue date Dec 16, 2008
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,324,214
- Issue date Jan 29, 2008
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,271,918
- Issue date Sep 18, 2007
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using height scanning interfer...
- Patent number 7,239,398
- Issue date Jul 3, 2007
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Profiling complex surface structures using scanning interferometry
- Patent number 7,106,454
- Issue date Sep 12, 2006
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for increasing signal to noise ratio in a phot...
- Patent number 7,050,178
- Issue date May 23, 2006
- Rudolph Technologies, Inc.
- Christopher Morath
- G01 - MEASURING TESTING
Information Patent Grant
System and methods providing automatic distributed data retrieval,...
- Patent number 6,944,662
- Issue date Sep 13, 2005
- Vinestone Corporation
- Robert L. S. Devine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical stress generator and detector
- Patent number 6,400,449
- Issue date Jun 4, 2002
- Brown University Research Foundation
- Humphrey J. Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical stress generator and detector
- Patent number 6,271,921
- Issue date Aug 7, 2001
- Brown University Research Foundation
- Humphrey J. Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical stress generator and detector
- Patent number 6,208,421
- Issue date Mar 27, 2001
- Brown University Research Foundation
- Humphrey J. Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical stress generator and detector
- Patent number 6,175,416
- Issue date Jan 16, 2001
- Brown University Research Foundation
- Humphrey J. Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical stress generator and detector
- Patent number 5,959,735
- Issue date Sep 28, 1999
- Brown University Research Foundation
- Humphrey J Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical method for determining the mechanical properties of a material
- Patent number 5,844,684
- Issue date Dec 1, 1998
- Brown University Research Foundation
- Humphrey J Maris
- G01 - MEASURING TESTING
Information Patent Grant
Optical stress generator and detector
- Patent number 5,748,318
- Issue date May 5, 1998
- Brown University Research Foundation
- Humphrey J Maris
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for characterizing thin film and interfaces us...
- Patent number 5,748,317
- Issue date May 5, 1998
- Brown University Research Foundation
- Humphrey J Maris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20100265516
- Publication date Oct 21, 2010
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
- Publication number 20090303493
- Publication date Dec 10, 2009
- Zygo Corporation
- Xavier Colonna de Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20080266574
- Publication date Oct 30, 2008
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR LATERAL METROLOGY
- Publication number 20080180685
- Publication date Jul 31, 2008
- Zygo Corporation
- XAVIER COLONNA DE LEGA
- G01 - MEASURING TESTING
Information Patent Application
PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY
- Publication number 20080065350
- Publication date Mar 13, 2008
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using height scanning interfer...
- Publication number 20070097380
- Publication date May 3, 2007
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometer and method for measuring characteristics of opticall...
- Publication number 20070046953
- Publication date Mar 1, 2007
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using scanning interferometry
- Publication number 20050073692
- Publication date Apr 7, 2005
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using scanning interferometry
- Publication number 20040189999
- Publication date Sep 30, 2004
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for increasing signal to noise ratio in a phot...
- Publication number 20030020929
- Publication date Jan 30, 2003
- Christopher Morath
- G01 - MEASURING TESTING
Information Patent Application
System and methods providing automatic distributed data retrieval,...
- Publication number 20020095399
- Publication date Jul 18, 2002
- Robert L.S. Devine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical stress generator and detector
- Publication number 20010028460
- Publication date Oct 11, 2001
- Humphrey J. Maris
- G01 - MEASURING TESTING

Robert J. Stoner

Person

Patents Grantslast 30 patents

Interferometry for lateral metrology

Interferometer and method for measuring characteristics of opticall...

Interferometry for lateral metrology

Interferometer and method for measuring characteristics of opticall...

Profiling complex surface structures using scanning interferometry

Interferometer and method for measuring characteristics of opticall...

Profiling complex surface structures using scanning interferometry

Profiling complex surface structures using height scanning interfer...

Profiling complex surface structures using scanning interferometry

Method and apparatus for increasing signal to noise ratio in a phot...

System and methods providing automatic distributed data retrieval,...

Optical stress generator and detector

Optical stress generator and detector

Optical stress generator and detector

Optical stress generator and detector

Optical stress generator and detector

Optical method for determining the mechanical properties of a material

Optical stress generator and detector

Apparatus and method for characterizing thin film and interfaces us...

Patents Applicationslast 30 patents

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

INTERFEROMETRY FOR LATERAL METROLOGY

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

INTERFEROMETRY FOR LATERAL METROLOGY

PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY

Profiling complex surface structures using height scanning interfer...

Interferometer and method for measuring characteristics of opticall...

Profiling complex surface structures using scanning interferometry

Profiling complex surface structures using scanning interferometry

Method and apparatus for increasing signal to noise ratio in a phot...

System and methods providing automatic distributed data retrieval,...

Optical stress generator and detector