Robert J. WOOLHISER

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for measuring inter-chip signals
- Patent number 8,384,411
- Issue date Feb 26, 2013
- Tektronix, Inc.
- Bart A. Mooyman-Beck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Device for Measuring Inter-chip Signals
- Publication number 20110148456
- Publication date Jun 23, 2011
- Tektronix, Inc.
- Bart A. MOOYMAN-BECK
- G01 - MEASURING TESTING