Robert Jackson

Person

Mesa, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated VI probe
- Patent number 7,154,256
- Issue date Dec 26, 2006
- Tokyo Electron Limited
- Richard Parsons
- G01 - MEASURING TESTING
Information Patent Grant
Portable VI probe
- Patent number 7,102,345
- Issue date Sep 5, 2006
- Tokyo Electron Limited
- Robert Jackson
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for high efficiency power amplification
- Patent number 6,097,252
- Issue date Aug 1, 2000
- Motorola, Inc.
- Bernard Eugene Sigmon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for high efficiency power amplification
- Patent number 5,942,938
- Issue date Aug 24, 1999
- Motorola, Inc.
- Ronald Gene Myers
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for reducing distortion in a power amplifier
- Patent number 5,886,572
- Issue date Mar 23, 1999
- Motorola, Inc.
- Ronald Gene Myers
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for compensation of phase distortion in power...
- Patent number 5,861,777
- Issue date Jan 19, 1999
- Motorola, Inc.
- Bernard Eugene Sigmon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for generating a modulated signal
- Patent number 5,838,210
- Issue date Nov 17, 1998
- Motorola, Inc.
- Pallab Midya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Linear power amplifier using active bias for high efficiency and me...
- Patent number 5,739,723
- Issue date Apr 14, 1998
- Motorola, Inc.
- Bernard Eugene Sigmon
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Integrated vi probe
- Publication number 20050184668
- Publication date Aug 25, 2005
- TOKYO ELECTRON LIMITED
- Rick Parsons
- G01 - MEASURING TESTING
Information Patent Application
Portable VI probe
- Publication number 20040027113
- Publication date Feb 12, 2004
- TOKYO ELECTRON LIMITED
- Robert Jackson
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for measuring and controlling substrate hol...
- Publication number 20030016727
- Publication date Jan 23, 2003
- TOKYO ELECTRON LIMITED
- William Jones
- G01 - MEASURING TESTING

Robert Jackson

Person

Patents Grantslast 30 patents

Integrated VI probe

Portable VI probe

Method and apparatus for high efficiency power amplification

Method and apparatus for high efficiency power amplification

Method and apparatus for reducing distortion in a power amplifier

Method and apparatus for compensation of phase distortion in power...

Method and apparatus for generating a modulated signal

Linear power amplifier using active bias for high efficiency and me...

Patents Applicationslast 30 patents

Integrated vi probe

Portable VI probe

Method of and apparatus for measuring and controlling substrate hol...