Robert Jeffrey Baseman

Person

Brewster, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Tool control using multistage LSTM for predicting on-wafer measurem...
- Patent number 12,197,133
- Issue date Jan 14, 2025
- International Business Machines Corporation
- Dung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle asset modeling using language processing methods
- Patent number 12,073,152
- Issue date Aug 27, 2024
- International Business Machines Corporation
- Elham Khabiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model management for non-stationary systems
- Patent number 11,954,615
- Issue date Apr 9, 2024
- International Business Machines Corporation
- Dung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer asset modeling using language processing methods
- Patent number 11,599,690
- Issue date Mar 7, 2023
- International Business Machines Corporation
- Elham Khabiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Anomaly detection and remedial recommendation
- Patent number 11,410,891
- Issue date Aug 9, 2022
- International Business Machines Corporation
- Dzung Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlling multi-stage manufacturing process based on internet of...
- Patent number 11,022,965
- Issue date Jun 1, 2021
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Controlling multi-stage manufacturing process based on internet of...
- Patent number 10,585,425
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Robert J. Baseman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Controlling multi-stage manufacturing process based on internet of...
- Patent number 10,365,640
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for identifying significant and consumable-insens...
- Patent number 9,915,942
- Issue date Mar 13, 2018
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
System for wafer quality predictive modeling based on multi-source...
- Patent number 9,395,408
- Issue date Jul 19, 2016
- GLOBALFOUNDRIES Inc.
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Run-to-run control utilizing virtual metrology in semiconductor man...
- Patent number 9,299,623
- Issue date Mar 29, 2016
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Run-to-run control utilizing virtual metrology in semiconductor man...
- Patent number 9,240,360
- Issue date Jan 19, 2016
- International Business Machines Corporation
- Robert Jeffrey Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for wafer quality predictive modeling based on mu...
- Patent number 9,176,183
- Issue date Nov 3, 2015
- GLOBALFOUNDRIES, INC.
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Continuous prediction of expected chip performance throughout the p...
- Patent number 8,793,106
- Issue date Jul 29, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for hierarchical wafer quality predictive mode...
- Patent number 8,732,627
- Issue date May 20, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Comprehensive analysis of queue times in microelectronic manufacturing
- Patent number 8,718,809
- Issue date May 6, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhancing investigation of variability by inclusion of similar obje...
- Patent number 8,639,375
- Issue date Jan 28, 2014
- International Business Machines Corporation
- Robert J. Baseman
- G01 - MEASURING TESTING
Information Patent Grant
Detecting combined tool incompatibilities and defects in semiconduc...
- Patent number 8,594,821
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for evaluating a machine tool operating character...
- Patent number 8,594,826
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Ehud Aharoni
- G05 - CONTROLLING REGULATING
Information Patent Grant
Rule-based root cause and alias analysis for semiconductor manufact...
- Patent number 8,533,635
- Issue date Sep 10, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign material contamination detection
- Patent number 8,328,950
- Issue date Dec 11, 2012
- International Business Machines Corporation
- Robert J. Baseman
- B08 - CLEANING
Information Patent Grant
Enhancing investigation of variability by inclusion of similar obje...
- Patent number 8,315,729
- Issue date Nov 20, 2012
- International Business Machines Corporation
- Robert J. Baseman
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for evaluating a machine tool operating character...
- Patent number 8,285,414
- Issue date Oct 9, 2012
- International Business Machines Corporation
- Ehud Aharoni
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predicting wafer failure using learned probability
- Patent number 7,962,302
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Robert Jeffrey Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for rule-based data mining and problem detection...
- Patent number 7,650,251
- Issue date Jan 19, 2010
- International Business Machines Corporation
- Robert J. Baseman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for rule-based data mining and problem detection...
- Patent number 7,539,585
- Issue date May 26, 2009
- International Business Machines Corporation
- Robert J. Baseman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Value-based framework for inventory management
- Patent number 7,363,259
- Issue date Apr 22, 2008
- International Business Machines Corporation
- Robert Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for integrated supply chain and financial management
- Patent number 6,671,673
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Robert Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vapor drain system
- Patent number 5,346,518
- Issue date Sep 13, 1994
- International Business Machines Corporation
- Robert J. Baseman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Thin film magnetic recording medium with controlled grain morpholog...
- Patent number 5,134,038
- Issue date Jul 28, 1992
- International Business Machines Corporation
- Robert J. Baseman
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DETECTING AND MITIGATING SYSTEM ANOMALIES USING KNOWLEDGE GRAPHS
- Publication number 20240333739
- Publication date Oct 3, 2024
- International Business Machines Corporation
- Bhavna Agrawal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
USING SEQUENCE MINING TO PREDICT QUALITY AND YIELD
- Publication number 20240047279
- Publication date Feb 8, 2024
- International Business Machines Corporation
- Robert Jeffrey Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMAL MATERIALS AND DEVICES DESIGN USING ARTIFICIAL INTELLIGENCE
- Publication number 20230281363
- Publication date Sep 7, 2023
- International Business Machines Corporation
- Dzung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPERATING MODE DETECTION FOR A MULTI-MODAL SYSTEM
- Publication number 20230281364
- Publication date Sep 7, 2023
- International Business Machines Corporation
- Dzung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER ASSET MODELING USING LANGUAGE PROCESSING METHODS
- Publication number 20220019710
- Publication date Jan 20, 2022
- International Business Machines Corporation
- Elham Khabiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE ASSET MODELING USING LANGUAGE PROCESSING METHODS
- Publication number 20220019708
- Publication date Jan 20, 2022
- International Business Machines Corporation
- Elham Khabiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL MANAGEMENT FOR NON-STATIONARY SYSTEMS
- Publication number 20210117836
- Publication date Apr 22, 2021
- International Business Machines
- Dung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOOL CONTROL USING MULTISTAGE LSTM FOR PREDICTING ON-WAFER MEASUREM...
- Publication number 20210103221
- Publication date Apr 8, 2021
- International Business Machines Corporation
- Dung Tien Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomaly Detection and Remedial Recommendation
- Publication number 20210066141
- Publication date Mar 4, 2021
- International Business Machines Corporation
- Dzung Phan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...
- Publication number 20190243346
- Publication date Aug 8, 2019
- International Business Machines Corporation
- Robert J. Baseman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
STATISTICAL FRAMEWORK FOR TOOL CHAMBER MATCHING IN SEMICONDUCTOR MA...
- Publication number 20190198405
- Publication date Jun 27, 2019
- International Business Machines Corporation
- Zhiguo LI
- G05 - CONTROLLING REGULATING
Information Patent Application
CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...
- Publication number 20180292811
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Application
CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...
- Publication number 20180292812
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING SIGNIFICANT AND CONSUMABLE-INSENS...
- Publication number 20160274177
- Publication date Sep 22, 2016
- International Business Machines Corporation
- Robert J. Baseman
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Wafer Quality Predictive Modeling based on Mu...
- Publication number 20140107828
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Wafer Quality Predictive Modeling based on Mu...
- Publication number 20140107824
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Yada Zhu
- G01 - MEASURING TESTING
Information Patent Application
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...
- Publication number 20140031969
- Publication date Jan 30, 2014
- International Business Machines Corporation
- Robert J. Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...
- Publication number 20140031968
- Publication date Jan 30, 2014
- International Business Machines Corporation
- Robert Jeffrey Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...
- Publication number 20130339919
- Publication date Dec 19, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...
- Publication number 20130338808
- Publication date Dec 19, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCING INVESTIGATION OF VARIABILITY BY INCLUSION OF SIMILAR OBJE...
- Publication number 20130103178
- Publication date Apr 25, 2013
- International Business Machines Corporation
- Robert J. Baseman
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS PREDICTION OF EXPECTED CHIP PERFORMANCE THROUHOUT THE PR...
- Publication number 20130080125
- Publication date Mar 28, 2013
- International Business Machines Corporation
- Robert J. Baseman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING A MACHINE TOOL OPERATING CHARACTER...
- Publication number 20130006406
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Ehud Aharoni
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
COMPREHENSIVE ANALYSIS OF QUEUE TIMES IN MICROELECTRONIC MANUFACTURING
- Publication number 20120330450
- Publication date Dec 27, 2012
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR MONITORING MULTI-ORDERABLE MEASUREMENT DATA
- Publication number 20120316818
- Publication date Dec 13, 2012
- International Business Machines Corporation
- Robert J. Baseman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
DETECTING COMBINED TOOL INCOMPATIBILITIES AND DEFECTS IN SEMICONDUC...
- Publication number 20120215335
- Publication date Aug 23, 2012
- International Business Machines Corporation
- Robert J. Baseman
- G05 - CONTROLLING REGULATING
Information Patent Application
FOREIGN MATERIAL CONTAMINATION DETECTION
- Publication number 20110284029
- Publication date Nov 24, 2011
- International Business Machines Corporation
- Robert J. Baseman
- B08 - CLEANING
Information Patent Application
COMPREHENSIVE ANALYSIS OF QUEUE TIMES IN MICROELECTRONIC MANUFACTURING
- Publication number 20110282472
- Publication date Nov 17, 2011
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCING INVESTIGATION OF VARIABILITY BY INCLUSION OF SIMILAR OBJE...
- Publication number 20110276170
- Publication date Nov 10, 2011
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RULE-BASED ROOT CAUSE AND ALIAS ANALYSIS FOR SEMICONDUCTOR MANUFACT...
- Publication number 20110178624
- Publication date Jul 21, 2011
- International Business Machines Corporation
- Robert J. Baseman
- G06 - COMPUTING CALCULATING COUNTING

Robert Jeffrey Baseman

Person

Patents Grantslast 30 patents

Tool control using multistage LSTM for predicting on-wafer measurem...

Vehicle asset modeling using language processing methods

Model management for non-stationary systems

Wafer asset modeling using language processing methods

Anomaly detection and remedial recommendation

Controlling multi-stage manufacturing process based on internet of...

Controlling multi-stage manufacturing process based on internet of...

Controlling multi-stage manufacturing process based on internet of...

System and method for identifying significant and consumable-insens...

System for wafer quality predictive modeling based on multi-source...

Run-to-run control utilizing virtual metrology in semiconductor man...

Run-to-run control utilizing virtual metrology in semiconductor man...

Method and system for wafer quality predictive modeling based on mu...

Continuous prediction of expected chip performance throughout the p...

Method and apparatus for hierarchical wafer quality predictive mode...

Comprehensive analysis of queue times in microelectronic manufacturing

Enhancing investigation of variability by inclusion of similar obje...

Detecting combined tool incompatibilities and defects in semiconduc...

Method and system for evaluating a machine tool operating character...

Rule-based root cause and alias analysis for semiconductor manufact...

Foreign material contamination detection

Enhancing investigation of variability by inclusion of similar obje...

Method and system for evaluating a machine tool operating character...

Predicting wafer failure using learned probability

System and method for rule-based data mining and problem detection...

System and method for rule-based data mining and problem detection...

Value-based framework for inventory management

Method for integrated supply chain and financial management

Vapor drain system

Thin film magnetic recording medium with controlled grain morpholog...

Patents Applicationslast 30 patents

DETECTING AND MITIGATING SYSTEM ANOMALIES USING KNOWLEDGE GRAPHS

USING SEQUENCE MINING TO PREDICT QUALITY AND YIELD

OPTIMAL MATERIALS AND DEVICES DESIGN USING ARTIFICIAL INTELLIGENCE

AUTOMATED OPERATING MODE DETECTION FOR A MULTI-MODAL SYSTEM

WAFER ASSET MODELING USING LANGUAGE PROCESSING METHODS

VEHICLE ASSET MODELING USING LANGUAGE PROCESSING METHODS

MODEL MANAGEMENT FOR NON-STATIONARY SYSTEMS

TOOL CONTROL USING MULTISTAGE LSTM FOR PREDICTING ON-WAFER MEASUREM...

Anomaly Detection and Remedial Recommendation

CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...

STATISTICAL FRAMEWORK FOR TOOL CHAMBER MATCHING IN SEMICONDUCTOR MA...

CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...

CONTROLLING MULTI-STAGE MANUFACTURING PROCESS BASED ON INTERNET OF...

SYSTEM AND METHOD FOR IDENTIFYING SIGNIFICANT AND CONSUMABLE-INSENS...

Method and System for Wafer Quality Predictive Modeling based on Mu...

Method and System for Wafer Quality Predictive Modeling based on Mu...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Man...

Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...

Method and Apparatus for Hierarchical Wafer Quality Predictive Mode...

ENHANCING INVESTIGATION OF VARIABILITY BY INCLUSION OF SIMILAR OBJE...

CONTINUOUS PREDICTION OF EXPECTED CHIP PERFORMANCE THROUHOUT THE PR...

METHOD AND SYSTEM FOR EVALUATING A MACHINE TOOL OPERATING CHARACTER...

COMPREHENSIVE ANALYSIS OF QUEUE TIMES IN MICROELECTRONIC MANUFACTURING

SYSTEM FOR MONITORING MULTI-ORDERABLE MEASUREMENT DATA

DETECTING COMBINED TOOL INCOMPATIBILITIES AND DEFECTS IN SEMICONDUC...

FOREIGN MATERIAL CONTAMINATION DETECTION

COMPREHENSIVE ANALYSIS OF QUEUE TIMES IN MICROELECTRONIC MANUFACTURING

ENHANCING INVESTIGATION OF VARIABILITY BY INCLUSION OF SIMILAR OBJE...

RULE-BASED ROOT CAUSE AND ALIAS ANALYSIS FOR SEMICONDUCTOR MANUFACT...