Robert John WILBY

Person

Almondsbury, Bristol, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for determining information relating to the mass...
- Patent number 9,903,750
- Issue date Feb 27, 2018
- METRYX LTD.
- Robert John Wilby
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Semiconductor wafer processing methods and apparatus
- Patent number 9,818,658
- Issue date Nov 14, 2017
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer monitoring apparatus and method
- Patent number 9,349,624
- Issue date May 24, 2016
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 9,310,244
- Issue date Apr 12, 2016
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer weight metrology apparatus
- Patent number 9,228,886
- Issue date Jan 5, 2016
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 8,683,880
- Issue date Apr 1, 2014
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer metrology apparatus and method
- Patent number 8,357,548
- Issue date Jan 22, 2013
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,447
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 8,200,353
- Issue date Jun 12, 2012
- Metryx Limited
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus
- Patent number 7,892,863
- Issue date Feb 22, 2011
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating parameters of layers deposit...
- Patent number 7,340,372
- Issue date Mar 4, 2008
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating semiconductors wafer
- Patent number 7,020,577
- Issue date Mar 28, 2006
- Metryx Limited
- Robert John Wilby
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS
- Publication number 20170115158
- Publication date Apr 27, 2017
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS
- Publication number 20170005019
- Publication date Jan 5, 2017
- METRYX LIMITED
- Robert John WILBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...
- Publication number 20160195424
- Publication date Jul 7, 2016
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Wafer Metrology Apparatus and Method
- Publication number 20140231152
- Publication date Aug 21, 2014
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Wafer Metrology Apparatus
- Publication number 20130118816
- Publication date May 16, 2013
- METRYX LIMITED
- Robert John WILBY
- G01 - MEASURING TESTING
Information Patent Application
Measuring Apparatus
- Publication number 20110119009
- Publication date May 19, 2011
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Wafer Monitoring Apparatus and Method
- Publication number 20110015773
- Publication date Jan 20, 2011
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER METROLOGY APPARATUS AND METHOD
- Publication number 20100285614
- Publication date Nov 11, 2010
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER METROLOGY APPARATUS AND METHOD
- Publication number 20100206098
- Publication date Aug 19, 2010
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20100147078
- Publication date Jun 17, 2010
- Robert John Wilby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS
- Publication number 20080087106
- Publication date Apr 17, 2008
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for investigating semiconductor wafers
- Publication number 20060095228
- Publication date May 4, 2006
- Robert John Wilby
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for investigating semiconductors wafer
- Publication number 20030141572
- Publication date Jul 31, 2003
- Robert John Wilby
- G01 - MEASURING TESTING

Robert John WILBY

Person

Patents Grantslast 30 patents

Method and device for determining information relating to the mass...

Semiconductor wafer processing methods and apparatus

Semiconductor wafer monitoring apparatus and method

Semiconductor wafer metrology apparatus and method

Semiconductor wafer weight metrology apparatus

Semiconductor wafer metrology apparatus and method

Semiconductor wafer metrology apparatus and method

Measuring apparatus

Measuring apparatus

Measuring apparatus

Apparatus and method for investigating parameters of layers deposit...

Apparatus and method for investigating semiconductors wafer

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER WEIGHING APPARATUS AND METHODS

SEMICONDUCTOR WAFER PROCESSING METHODS AND APPARATUS

METHOD AND DEVICE FOR DETERMINING INFORMATION RELATING TO THE MASS...

Semiconductor Wafer Metrology Apparatus and Method

Semiconductor Wafer Metrology Apparatus

Measuring Apparatus

Semiconductor Wafer Monitoring Apparatus and Method

SEMICONDUCTOR WAFER METROLOGY APPARATUS AND METHOD

SEMICONDUCTOR WAFER METROLOGY APPARATUS AND METHOD

MEASURING APPARATUS

MEASURING APPARATUS

Apparatus and method for investigating semiconductor wafers

Apparatus and method for investigating semiconductors wafer