Robert L. Gerlach

Person

Minnetonka, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multichannel charged-particle analyzer
- Patent number 5,032,724
- Issue date Jul 16, 1991
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Direct imaging monochromatic electron microscope
- Patent number 4,882,487
- Issue date Nov 21, 1989
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Direct imaging monochromatic electron microscope
- Patent number 4,810,880
- Issue date Mar 7, 1989
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High luminosity spherical analyzer for charged particles
- Patent number 4,806,754
- Issue date Feb 21, 1989
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum-compatible air-cooled plasma device
- Patent number 4,659,899
- Issue date Apr 21, 1987
- The Perkin-Elmer Corporation
- David G. Welkie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample transport system
- Patent number 4,412,771
- Issue date Nov 1, 1983
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- C30 - CRYSTAL GROWTH
Information Patent Grant
Magnetic lens
- Patent number 4,345,152
- Issue date Aug 17, 1982
- The Perkin-Elmer Corporation
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auger electron spectroscopy
- Patent number 4,205,226
- Issue date May 27, 1980
- The Perkin-Elmer Corporation
- Robert Gerlach
- G01 - MEASURING TESTING
Information Patent Grant
Scanning auger microprobe with variable axial aperture
- Patent number 4,048,498
- Issue date Sep 13, 1977
- Physical Electronics Industries, Inc.
- Robert L. Gerlach
- H01 - BASIC ELECTRIC ELEMENTS

Robert L. Gerlach

Person

Patents Grantslast 30 patents

Multichannel charged-particle analyzer

Direct imaging monochromatic electron microscope

Direct imaging monochromatic electron microscope

High luminosity spherical analyzer for charged particles

Vacuum-compatible air-cooled plasma device

Sample transport system

Magnetic lens

Auger electron spectroscopy

Scanning auger microprobe with variable axial aperture