Robert L. Hance

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for in-line measuring backside wafer-level con...
- Patent number 5,930,586
- Issue date Jul 27, 1999
- Motorola, Inc.
- Ajay Jain
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Amorphous metal oxide gate dielectric structure and method thereof
- Publication number 20030054669
- Publication date Mar 20, 2003
- Prasad V. Alluri
- H01 - BASIC ELECTRIC ELEMENTS