Robert L. Howell

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for analyzing electronic devices having opposing...
- Patent number 9,989,557
- Issue date Jun 5, 2018
- Exatron, Inc.
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing electronic devices having opposing...
- Patent number 8,928,342
- Issue date Jan 6, 2015
- Exatron, Inc.
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing electronic devices having a cab for...
- Patent number 8,466,705
- Issue date Jun 18, 2013
- Exatron, Inc.
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Grant
Interconnecting assembly with conductive lever portions on a suppor...
- Patent number 7,914,296
- Issue date Mar 29, 2011
- Exatron, Inc.
- Robert P. Howell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of constructing an interposer
- Patent number 7,290,332
- Issue date Nov 6, 2007
- Exatron, Inc.
- Robert P. Howell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for assembling electronics
- Patent number 6,925,709
- Issue date Aug 9, 2005
- Exatron, Inc.
- Robert P. Howell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test socket interposer
- Patent number 6,703,851
- Issue date Mar 9, 2004
- Exatron, Inc.
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sequentially programming memory-containing in...
- Patent number 6,584,553
- Issue date Jun 24, 2003
- Exatron, Inc.
- Robert L. Howell
- G11 - INFORMATION STORAGE
Information Patent Grant
High density electrical connector assembly and connector for use th...
- Patent number 6,241,532
- Issue date Jun 5, 2001
- Exatron, Inc.
- Robert P. Howell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tester for integrated circuits
- Patent number 5,596,282
- Issue date Jan 21, 1997
- Texas Instruments Incorporated
- James N. Giddings
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ANALYZING ELECTRONIC DEVICES HAVING OPPOSING...
- Publication number 20150160263
- Publication date Jun 11, 2015
- Exatron, Inc.
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ANALYZING ELECTRONIC DEVICES HAVING OPPOSING...
- Publication number 20140084952
- Publication date Mar 27, 2014
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF DETERMINING A PARAMETER OF A MEASURED ELECTRON...
- Publication number 20140088909
- Publication date Mar 27, 2014
- Robert P. Howell
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for measuring temperature
- Publication number 20080262773
- Publication date Oct 23, 2008
- Exatron Inc.
- Robert L. Howell
- G01 - MEASURING TESTING
Information Patent Application
Method and system for sequentially programming memory-containing in...
- Publication number 20020013878
- Publication date Jan 31, 2002
- EXANTRON, INC.
- Robert L. Howell
- G11 - INFORMATION STORAGE

Robert L. Howell

Person

Patents Grantslast 30 patents

System and method for analyzing electronic devices having opposing...

System and method for analyzing electronic devices having opposing...

System and method for analyzing electronic devices having a cab for...

Interconnecting assembly with conductive lever portions on a suppor...

Method of constructing an interposer

Method and apparatus for assembling electronics

Test socket interposer

Method and system for sequentially programming memory-containing in...

High density electrical connector assembly and connector for use th...

Tester for integrated circuits

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ANALYZING ELECTRONIC DEVICES HAVING OPPOSING...

SYSTEM AND METHOD FOR ANALYZING ELECTRONIC DEVICES HAVING OPPOSING...

SYSTEM AND METHOD OF DETERMINING A PARAMETER OF A MEASURED ELECTRON...

Systems and methods for measuring temperature

Method and system for sequentially programming memory-containing in...