Robert L. Michals

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Marlboro, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated test and assembly device
- Patent number 4,312,117
- Issue date Jan 26, 1982
- Raytheon Company
- David R. Robillard
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test and assembly device
- Patent number 4,096,348
- Issue date Jun 20, 1978
- Raytheon Company
- David R. Robillard
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit chip test and assembly package
- Patent number 3,984,620
- Issue date Oct 5, 1976
- Raytheon Company
- David R. Robillard
- G01 - MEASURING TESTING