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Robert L. Stokes
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Redondo Beach, CA, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for athermal operation of a focal plane array
Patent number
8,124,937
Issue date
Feb 28, 2012
Raytheon Company
Todd E. Sessler
G01 - MEASURING TESTING
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Patent Grant
Means for testing dynamic integrated circuits
Patent number
6,324,664
Issue date
Nov 27, 2001
Raytheon Company
William D. Farwell
G01 - MEASURING TESTING
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Patent Grant
Scan testing digital logic with differing frequencies of system clo...
Patent number
5,717,702
Issue date
Feb 10, 1998
Hughes Electronics
Robert L. Stokes
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System and Method for Athermal Operation of a Focal Plane Array
Publication number
20100176305
Publication date
Jul 15, 2010
Raytheon Company
Todd E. Sessler
G01 - MEASURING TESTING