Robert M. Angelo

Person

San Francisco, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 12,135,300
- Issue date Nov 5, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 10,408,814
- Issue date Sep 10, 2019
- The Board of Trustees ofthe Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 10,114,004
- Issue date Oct 30, 2018
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiplexed imaging of tissues using mass tags and secondary ion ma...
- Patent number 10,041,949
- Issue date Aug 7, 2018
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 9,797,879
- Issue date Oct 24, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single cell analysis using secondary ion mass spectrometry
- Patent number 9,766,224
- Issue date Sep 19, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for sub-micrometer elemental image analysis by...
- Patent number 9,312,111
- Issue date Apr 12, 2016
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
USE OF ORGANIC CONDUCTIVE POLYMER FOR MULTIPLEX ION BEAM IMAGING
- Publication number 20250179326
- Publication date Jun 5, 2025
- The Board of Trustees of the Leland Stanford Junior University
- Marc BOSSE
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
FEATURES FOR DETERMINING DUCTAL CARCINOMA IN SITU RECURRENCE AND PR...
- Publication number 20240044900
- Publication date Feb 8, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Tyler Risom
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20210310970
- Publication date Oct 7, 2021
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20190339250
- Publication date Nov 7, 2019
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MA...
- Publication number 20190162729
- Publication date May 30, 2019
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...
- Publication number 20180024111
- Publication date Jan 25, 2018
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20170343529
- Publication date Nov 30, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY...
- Publication number 20170178882
- Publication date Jun 22, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...
- Publication number 20160313295
- Publication date Oct 27, 2016
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY
- Publication number 20160282325
- Publication date Sep 29, 2016
- The Board of Trustees of the Leland Stanford Junior University
- Garry P. Nolan
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY...
- Publication number 20150287578
- Publication date Oct 8, 2015
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MA...
- Publication number 20150080233
- Publication date Mar 19, 2015
- The Board of Trustees of the Leland Stanford Junior University
- Sean C. Bendall
- G01 - MEASURING TESTING

Robert M. Angelo

Person

Patents Grantslast 30 patents

Single cell analysis using secondary ion mass spectrometry

Method for multiplexed sample analysis by photoionizing secondary s...

Single cell analysis using secondary ion mass spectrometry

Multiplexed imaging of tissues using mass tags and secondary ion ma...

Method for multiplexed sample analysis by photoionizing secondary s...

Single cell analysis using secondary ion mass spectrometry

Apparatus and method for sub-micrometer elemental image analysis by...

Patents Applicationslast 30 patents

USE OF ORGANIC CONDUCTIVE POLYMER FOR MULTIPLEX ION BEAM IMAGING

FEATURES FOR DETERMINING DUCTAL CARCINOMA IN SITU RECURRENCE AND PR...

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MA...

METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY...

METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...

SINGLE CELL ANALYSIS USING SECONDARY ION MASS SPECTROMETRY

APPARATUS AND METHOD FOR SUB-MICROMETER ELEMENTAL IMAGE ANALYSIS BY...

MULTIPLEXED IMAGING OF TISSUES USING MASS TAGS AND SECONDARY ION MA...