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Robert M. Fox
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Gainesville, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
System, device, and method for embedded S-parameter measurement
Patent number
7,924,025
Issue date
Apr 12, 2011
University of Florida Research Foundation, Inc.
William R. Eisenstadt
G01 - MEASURING TESTING
Information
Patent Grant
Power detector of embedded IC test circuits
Patent number
7,925,229
Issue date
Apr 12, 2011
University of Florida Research Foundation, Inc.
William R. Eisenstadt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Distributed RF/microwave power detector
Patent number
7,839,137
Issue date
Nov 23, 2010
University of Florida Research Foundation, Inc.
Jongshick Ahn
G01 - MEASURING TESTING
Information
Patent Grant
Broadband active balun
Patent number
7,737,789
Issue date
Jun 15, 2010
University of Florida Research Foundation, Inc.
William Richard Eisenstadt
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Embedded IC test circuits and methods
Patent number
7,379,716
Issue date
May 27, 2008
University of Florida Research Foundation, Inc.
William R. Eisenstadt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
X-ray imaging system and solid state detector therefor
Patent number
5,440,130
Issue date
Aug 8, 1995
General Imaging Corporation
John D. Cox
G01 - MEASURING TESTING
Information
Patent Grant
X-ray imaging system and solid state detector therefor
Patent number
5,220,170
Issue date
Jun 15, 1993
General Imaging Corporation
John D. Cox
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Broadband Active Balun
Publication number
20100097154
Publication date
Apr 22, 2010
William Richard Eisenstadt
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
EMBEDDED IC TEST CIRCUITS AND METHODS
Publication number
20090005103
Publication date
Jan 1, 2009
University of Florida Research Foundation, Inc.
William R. Eisenstadt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Distributed Rf/Microwave Power Detector
Publication number
20080309321
Publication date
Dec 18, 2008
University of Florida Research Foundation, Inc.
Jongshick Ahn
G01 - MEASURING TESTING
Information
Patent Application
System, Device, and Method for Embedded S-Parameter Measurement
Publication number
20080191712
Publication date
Aug 14, 2008
University of Florida Research Foundation, Inc.
William R. Eisenstadt
G01 - MEASURING TESTING
Information
Patent Application
Embedded IC test circuits and methods
Publication number
20060217085
Publication date
Sep 28, 2006
University of Florida Research Foundation, Inc.
William R. Eisenstadt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Computer controlled curve tracer for extracting small and large sig...
Publication number
20030025520
Publication date
Feb 6, 2003
Steven A. Schein
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor test system and associated methods for wafer level ac...
Publication number
20030006413
Publication date
Jan 9, 2003
University of Florida
Ravi Chawla
G01 - MEASURING TESTING