Robert M. Glidden

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Rancho Palos Verdes, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Radio-frequency identification (RFID) tag-to-tag autoconnect discov...
- Patent number 9,165,232
- Issue date Oct 20, 2015
- Corning Incorporated
- Robert Mason Glidden
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RFID tag with bist circuits
- Patent number 7,380,190
- Issue date May 27, 2008
- Impinj, Inc.
- Dennis Kiyoshi Hara
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level testing for RFID tags
- Patent number 7,312,622
- Issue date Dec 25, 2007
- Impinj, Inc.
- John D. Hyde
- G01 - MEASURING TESTING
Information Patent Grant
RFID tag design with circuitry for wafer level testing
- Patent number 7,307,528
- Issue date Dec 11, 2007
- Impinj, Inc.
- Robert M. Glidden
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIO-FREQUENCY IDENTIFICATION (RFID) TAG-TO-TAG AUTOCONNECT DISCOV...
- Publication number 20130300539
- Publication date Nov 14, 2013
- Robert Mason Glidden
- G02 - OPTICS
Information Patent Application
RFID tag with bist circuits
- Publication number 20060125506
- Publication date Jun 15, 2006
- Dennis Kiyoshi Hara
- G01 - MEASURING TESTING
Information Patent Application
RFID tag design with circuitry for wafer level testing
- Publication number 20060125505
- Publication date Jun 15, 2006
- Robert M. Glidden
- G01 - MEASURING TESTING
Information Patent Application
Wafer level testing for RFID tags
- Publication number 20060125507
- Publication date Jun 15, 2006
- John D. Hyde
- G01 - MEASURING TESTING
Information Patent Application
On wafer testing of RFID tag circuit with pseudo antenna signal
- Publication number 20060125508
- Publication date Jun 15, 2006
- Impinj, Inc.
- Robert M. Glidden
- G06 - COMPUTING CALCULATING COUNTING