Robert Mainberger

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Braunfels, DE

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Patents Grantslast 30 patents

Information Patent Grant
Programmable microscope control unit having freely usable connectio...
- Patent number 11,550,137
- Issue date Jan 10, 2023
- Leica Microsystems CMS GmbH
- Markus Weber
- G02 - OPTICS
Information Patent Grant
Device and method for inspecting an object
- Patent number 7,271,889
- Issue date Sep 18, 2007
- Leica Microsystems CMS GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning a specimen using an optical imagi...
- Patent number 7,247,825
- Issue date Jul 24, 2007
- Vistec Semiconductor Systems GmbH
- Dirk Sönksen
- G02 - OPTICS
Information Patent Grant
Autofocus module and method for a microscope-based system
- Patent number 6,879,440
- Issue date Apr 12, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE MICROSCOPE CONTROL UNIT HAVING FREELY USABLE CONNECTIO...
- Publication number 20210116695
- Publication date Apr 22, 2021
- Leica Microsystems CMS GmbH
- Markus Weber
- G02 - OPTICS
Information Patent Application
MICROSCOPE WITH ILLUMINATION DEVICE
- Publication number 20150338629
- Publication date Nov 26, 2015
- LEICA MICROSYSTEMS CMS GMBH
- Jochen SIEPER
- G02 - OPTICS
Information Patent Application
Device and method for inspecting an object
- Publication number 20050259245
- Publication date Nov 24, 2005
- LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Method and apparatus for scanning a specimen using an optical imagi...
- Publication number 20040129859
- Publication date Jul 8, 2004
- Leica Microsystems Semiconductor GmbH
- Dirk Sonksen
- G02 - OPTICS
Information Patent Application
Autofocus module and method for a microscope-based system
- Publication number 20030147134
- Publication date Aug 7, 2003
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Method and apparatus for defect analysis of wafers
- Publication number 20030095252
- Publication date May 22, 2003
- Leica Microsystems Semiconductor GmbH
- Robert Mainberger
- G01 - MEASURING TESTING