Robert Mason

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Determining read voltage offset in memory devices
- Patent number 12,057,190
- Issue date Aug 6, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system failure detection and self recovery of memory dice
- Patent number 11,966,303
- Issue date Apr 23, 2024
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...
- Publication number 20240395348
- Publication date Nov 28, 2024
- Micron Technology, Inc.
- Kyle B. Brock-Petersen
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR MANAGING A VOLTAGE RECOVERY OPERATION
- Publication number 20240371452
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Pitamber Shukla
- G11 - INFORMATION STORAGE
Information Patent Application
KNOWN-FAILURE ERROR HANDLING IN A MEMORY SUB-SYSTEM
- Publication number 20240355402
- Publication date Oct 24, 2024
- Micron Technology, Inc.
- Robert Winston Mason
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES
- Publication number 20240347084
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE
- Publication number 20240220375
- Publication date Jul 4, 2024
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION
- Publication number 20240177760
- Publication date May 30, 2024
- Micron Technology, Inc.
- Robert Winston MASON
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES
- Publication number 20240071440
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING DEFECTIVE BLOCKS DURING MULTI-PLANE PROGRAMMING OPERATIONS...
- Publication number 20240071528
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Robert W. Mason
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE
- Publication number 20230393955
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REUSE OF BAD BLOCKS FOR TASKS IN A MEMORY SUB-SYSTEM
- Publication number 20230333762
- Publication date Oct 19, 2023
- Micron Technology, Inc.
- Robert Mason
- G06 - COMPUTING CALCULATING COUNTING

Robert Mason

Person

Patents Grantslast 30 patents

Determining read voltage offset in memory devices

Memory system failure detection and self recovery of memory dice

Patents Applicationslast 30 patents

MEMORY FAILURE ANALYSIS BASED ON BITLINE THRESHOLD VOLTAGE DISTRIBU...

TECHNIQUES FOR MANAGING A VOLTAGE RECOVERY OPERATION

KNOWN-FAILURE ERROR HANDLING IN A MEMORY SUB-SYSTEM

DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES

MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE

PROBABILISTIC DATA INTEGRITY SCANS USING RISK FACTOR ESTIMATION

DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES

MANAGING DEFECTIVE BLOCKS DURING MULTI-PLANE PROGRAMMING OPERATIONS...

MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE

REUSE OF BAD BLOCKS FOR TASKS IN A MEMORY SUB-SYSTEM