Robert Matthew Buckley

Person

Medford, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Obsolescence mitigation for programmable waveform digitizers
- Patent number 7,642,940
- Issue date Jan 5, 2010
- Advanced Testing Technologies, Inc.
- James McKenna
- G01 - MEASURING TESTING
Information Patent Grant
Obsolescence mitigation for electron bombarded semiconductor tubes...
- Patent number 7,358,877
- Issue date Apr 15, 2008
- Advanced Testing Technologies, Inc.
- Robert M. Buckley
- G01 - MEASURING TESTING
Information Patent Grant
Attenuator test system
- Patent number 7,065,466
- Issue date Jun 20, 2006
- Advanced Testing Technologies, Inc.
- Jeffrey R. Clarke
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring phase noise using a low noise synthesizer
- Patent number 6,480,006
- Issue date Nov 12, 2002
- Advanced Testing Technologies Inc.
- Robert Matthew Buckley
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for spectrally pure, programmable signal generation
- Patent number 6,429,796
- Issue date Aug 6, 2002
- Advanced Testing Technologies Inc.
- Robert M. Buckley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic testing device for signal evaluation
- Patent number 6,057,690
- Issue date May 2, 2000
- Advanced Testing Technologies, Inc.
- Robert Matthew Buckley
- G01 - MEASURING TESTING
Information Patent Grant
Low noise signal synthesizer and phase noise measurement system
- Patent number 5,952,834
- Issue date Sep 14, 1999
- Advanced Testing Technologies, Inc.
- Robert Matthew Buckley
- G01 - MEASURING TESTING
Information Patent Grant
Phase noise measurements utilizing a frequency down conversion/mult...
- Patent number 5,337,014
- Issue date Aug 9, 1994
- Harris Corporation
- Esteban G. Najle
- G01 - MEASURING TESTING
Information Patent Grant
Phase noise measurements utilizing a frequency down conversion/mult...
- Patent number 5,179,344
- Issue date Jan 12, 1993
- Harris Corporation
- Esteban G. Najle
- G01 - MEASURING TESTING
Information Patent Grant
Video display simulator and analyzer
- Patent number 4,752,825
- Issue date Jun 21, 1988
- Grumman Aerospace Corporation
- Robert M. Buckley
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
Attenuator test system
- Publication number 20050171716
- Publication date Aug 4, 2005
- Jeffrey R. Clarke
- G01 - MEASURING TESTING

Robert Matthew Buckley

Person

Patents Grantslast 30 patents

Obsolescence mitigation for programmable waveform digitizers

Obsolescence mitigation for electron bombarded semiconductor tubes...

Attenuator test system

Method for measuring phase noise using a low noise synthesizer

Method and device for spectrally pure, programmable signal generation

Automatic testing device for signal evaluation

Low noise signal synthesizer and phase noise measurement system

Phase noise measurements utilizing a frequency down conversion/mult...

Phase noise measurements utilizing a frequency down conversion/mult...

Video display simulator and analyzer

Patents Applicationslast 30 patents

Attenuator test system