Robert Muller

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Pseudo low volume reticle (PLVR) design for ASIC manufacturing
- Patent number 7,763,414
- Issue date Jul 27, 2010
- LSI Corporation
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mixed LVR and HVR reticle set design for the processing of gate arr...
- Patent number 7,057,261
- Issue date Jun 6, 2006
- LSI Logic Corporation
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography line width monitor reflecting chip-wide average feature...
- Patent number 7,016,054
- Issue date Mar 21, 2006
- LSI Logic Corporation
- Duane B. Barber
- G01 - MEASURING TESTING
Information Patent Grant
Mixed LVR and HVR reticle set design for the processing of gate arr...
- Patent number 6,900,075
- Issue date May 31, 2005
- LSI Logic Corporation
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PSEUDO LOW VOLUME RETICLE (PLVR) DESIGN FOR ASIC MANUFACTURING
- Publication number 20090034830
- Publication date Feb 5, 2009
- LSI Corporation
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Pseudo low volume reticle (PLVR) design for asic manufacturing
- Publication number 20060063076
- Publication date Mar 23, 2006
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mixed LVR and HVR reticle set design for the processing of gate arr...
- Publication number 20050147913
- Publication date Jul 7, 2005
- LSI Logic Corporation
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MIXED LVR AND HVR RETICLE SET DESIGN FOR THE PROCESSING OF GATE ARR...
- Publication number 20050093102
- Publication date May 5, 2005
- John Jensen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithography line width monitor reflecting chip-wide average feature...
- Publication number 20040190007
- Publication date Sep 30, 2004
- Duane B. Barber
- G01 - MEASURING TESTING