Robert N. Wiggin

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Interconnect package cluster probe short removal apparatus and method
- Patent number 6,753,688
- Issue date Jun 22, 2004
- International Business Machines Corporation
- Roger M. Eddy
- G01 - MEASURING TESTING
Information Patent Grant
Contamination-tolerant electrical test probe
- Patent number 6,429,672
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Robert N. Wiggin
- G01 - MEASURING TESTING
Information Patent Grant
Embedded structures to provide electrical testing for via to via an...
- Patent number 6,391,669
- Issue date May 21, 2002
- International Business Machines Corporation
- Benjamin V. Fasano
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Flexible conductive sheet
- Publication number 20020179320
- Publication date Dec 5, 2002
- International Business Machines Corporation
- Yuet-Ying Yu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Interconnect package cluster probe short removal apparatus and method
- Publication number 20020145434
- Publication date Oct 10, 2002
- International Business Machines Corporation
- Roger M. Eddy
- G01 - MEASURING TESTING
Information Patent Application
CONTAMINATION-TOLERANT ELECTRICAL TEST PROBE
- Publication number 20020003429
- Publication date Jan 10, 2002
- ROBERT N. WIGGIN
- G01 - MEASURING TESTING