Robert Neves

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Anaheim, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for rapid thermal testing
- Patent number 7,287,903
- Issue date Oct 30, 2007
- Conductor Analysis Technologies, Inc.
- Timothy A. Estes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for rapid thermal testing
- Publication number 20040233966
- Publication date Nov 25, 2004
- Conductor Analysis Technologies, Inc.
- Timothy A. Estes
- G01 - MEASURING TESTING