Membership
Tour
Register
Log in
Robert P. Fabinski
Follow
Person
Rochester, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Stitching methods using multiple microlithographic expose tools
Patent number
8,728,722
Issue date
May 20, 2014
Truesense Imaging, Inc.
Robert P. Fabinski
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Stitching methods using multiple microlithographic expose tools
Patent number
8,728,713
Issue date
May 20, 2014
Truesense Imaging, Inc.
Robert P. Fabinski
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Identification of dies on a semiconductor wafer
Patent number
8,415,813
Issue date
Apr 9, 2013
Truesense Imaging, Inc.
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Identification of dies on a semiconductor wafer
Patent number
8,415,175
Issue date
Apr 9, 2013
Truesense Imaging, Inc.
Shen Wang
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Elimination of glowing artifact in digital images captured by an im...
Patent number
8,022,452
Issue date
Sep 20, 2011
OmniVision Technologies, Inc.
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic serialization of image sensors
Patent number
7,522,203
Issue date
Apr 21, 2009
Eastman Kodak Company
Robert P. Fabinski
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Methods to eliminate amplifier glowing artifact in digital images c...
Patent number
7,402,882
Issue date
Jul 22, 2008
Eastman Kodak Company
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Varying feature size in resist across the chip without the artifact...
Patent number
6,870,168
Issue date
Mar 22, 2005
Eastman Kodak Company
Robert P. Fabinski
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
IDENTIFICATION OF DIES ON A SEMICONDUCTOR WAFER
Publication number
20120319307
Publication date
Dec 20, 2012
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IDENTIFICATION OF DIES ON A SEMICONDUCTOR WAFER
Publication number
20120322271
Publication date
Dec 20, 2012
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STITCHING METHODS USING MULTIPLE MICROLITHOGRAPHIC EXPOSE TOOLS
Publication number
20120082938
Publication date
Apr 5, 2012
Robert P. Fabinski
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
STITCHING METHODS USING MULTIPLE MICROLITHOGRAPHIC EXPOSE TOOLS
Publication number
20120082937
Publication date
Apr 5, 2012
Robert P. Fabinski
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
ELIMINATION OF GLOWING ARTIFACT IN DIGITAL IMAGES CAPTURED BY AN IM...
Publication number
20100148231
Publication date
Jun 17, 2010
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods to eliminate amplifier glowing artifact in digital images c...
Publication number
20060038203
Publication date
Feb 23, 2006
Eastman Kodak Company
Shen Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electronic serialization of image sensors
Publication number
20050073598
Publication date
Apr 7, 2005
Eastman Kodak Company
Robert P. Fabinski
H04 - ELECTRIC COMMUNICATION TECHNIQUE