Robert P. Moehrke

Follow

Person

Chubbuck, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Padé approximant based compensation for integrated sensor modules a...
- Patent number 7,944,214
- Issue date May 17, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Pade' approximant based compensation for integrated sensor modules...
- Patent number 7,859,269
- Issue date Dec 28, 2010
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Padé approximant based compensation for integrated sensor modules a...
- Patent number 7,378,858
- Issue date May 27, 2008
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Pade′ Approximant based compensation for integrated sensor modules...
- Patent number 7,190,178
- Issue date Mar 13, 2007
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Grant
Reactive sensor modules using Pade' Approximant based compensation...
- Patent number 7,006,938
- Issue date Feb 28, 2006
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PADE' APPROXIMANT BASED COMPENSATION FOR INTEGRATED SENSOR MODULES...
- Publication number 20110057709
- Publication date Mar 10, 2011
- Semiconductor Components Industries, LLC
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
Pade' approximant based compensation for integrated sensor modules...
- Publication number 20070132462
- Publication date Jun 14, 2007
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
REACTIVE SENSOR MODULES USING PADE' APPROXIMANT BASED COMPENSATION...
- Publication number 20050283330
- Publication date Dec 22, 2005
- Jose Marcos Laraia
- G01 - MEASURING TESTING
Information Patent Application
Pade' approximant based compensation for integrated sensor modules...
- Publication number 20050256660
- Publication date Nov 17, 2005
- AMI Semiconductor, Inc.
- Jose Marcos Laraia
- G01 - MEASURING TESTING