Robert P. Schnell

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Deerfield, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Qualitative and quantitative analysis using Raman scattering
- Patent number 4,620,284
- Issue date Oct 28, 1986
- UOP Inc.
- Robert P. Schnell
- G01 - MEASURING TESTING
Information Patent Grant
Detector for raman spectra and other weak light
- Patent number 4,575,629
- Issue date Mar 11, 1986
- UOP Inc.
- Robert P. Schnell
- G01 - MEASURING TESTING