Robert Petter

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Wandlitz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method for semiconductor yield loss calculation
- Patent number 6,717,431
- Issue date Apr 6, 2004
- Infineon Technologies Richmond, LP
- Dieter Rathei
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for semiconductor yield loss calculation
- Publication number 20030207474
- Publication date Nov 6, 2003
- Infineon Technologies North America Corp.
- Dieter Rathei
- H01 - BASIC ELECTRIC ELEMENTS