Robert Press

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measurement and control of wafer tilt for x-ray based metrology
- Patent number 11,513,085
- Issue date Nov 29, 2022
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement And Control Of Wafer Tilt For X-Ray Based Metrology
- Publication number 20210262950
- Publication date Aug 26, 2021
- KLA Corporation
- Barry Blasenheim
- G01 - MEASURING TESTING