Robert S. Okojie

Person

Strongsville, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-chip integrated silicon carbide pressure and temperature sensors
- Patent number 12,044,585
- Issue date Jul 23, 2024
- United States Government Administrator of NASA
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Single conductor alloy as diffusion barrier system and simultaneous...
- Patent number 10,515,804
- Issue date Dec 24, 2019
- United States of America as represented by the Administrator of National Aero...
- Robert S. Okojie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffusion barrier systems (DBS) for high temperature semiconductor...
- Patent number 10,381,455
- Issue date Aug 13, 2019
- United States of America as represented by the Administrator of National Aero...
- Robert Okojie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous ohmic contact to silicon carbide
- Patent number 10,192,970
- Issue date Jan 29, 2019
- The United States of America as Represented by the Administrator of National...
- Robert S. Okojie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material damage system and method for determining same
- Patent number 10,184,777
- Issue date Jan 22, 2019
- The United States of America as Represented by the Administrator of National...
- Robert S Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Modular apparatus and method for attaching multiple devices
- Patent number 10,067,025
- Issue date Sep 4, 2018
- The United States of America as Represented by the Administrator of National...
- Robert S Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Single conductor alloy as diffusion barrier system and simulataneou...
- Patent number 10,056,259
- Issue date Aug 21, 2018
- The United States of America as Represented by the Admin of National Aeronaut...
- Robert S. Okojie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabricating ultra-thin silicon carbide diaphragms
- Patent number 9,975,765
- Issue date May 22, 2018
- The United States of America as Represented by the Administrator of National...
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Material damage system and method for determining same
- Patent number 9,766,053
- Issue date Sep 19, 2017
- The United States of America as represented by the Administrator of NASA
- Robert Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Dopant selective reactive ion etching of silicon carbide
- Patent number 9,452,926
- Issue date Sep 27, 2016
- The United States of America as Represented by the Administrator of National...
- Robert Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Modular apparatus and method for attaching multiple devices
- Patent number 9,046,426
- Issue date Jun 2, 2015
- The United States of America as Represented by the Administrator of National...
- Robert S Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Dual ohmic contact to N- and P-type silicon carbide
- Patent number 8,373,175
- Issue date Feb 12, 2013
- The United States of America as Represented by the Administrator of National...
- Robert S. Okojie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS direct chip attach packaging methodologies and apparatuses for...
- Patent number 7,518,234
- Issue date Apr 14, 2009
- The United States of America as represented by the Administrator of the Natio...
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS direct chip attach packaging methodologies and apparatuses for...
- Patent number 6,845,664
- Issue date Jan 25, 2005
- The United States of America as Represented by the Administrator of National...
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of assembling a silicon carbide high temperature anemometer
- Patent number 6,794,213
- Issue date Sep 21, 2004
- The United States of America as represented by the administrator of the Natio...
- Robert S. Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Multi-functional micro electromechanical silicon carbide accelerometer
- Patent number 6,769,303
- Issue date Aug 3, 2004
- The United States of America as represented by the administrator of the Natio...
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Multi-functional micro electromechanical devices and method of bulk...
- Patent number 6,706,549
- Issue date Mar 16, 2004
- The United States of America as represented by the administrator of the Natio...
- Robert S. Okojie
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Silicon carbide high temperature anemometer and method for assembli...
- Patent number 6,647,809
- Issue date Nov 18, 2003
- The United States of America as represented by the administrator of the Natio...
- Robert S. Okojie
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for obtaining a precision thickness in semicon...
- Patent number 6,426,296
- Issue date Jul 30, 2002
- The United States of America as represented by the administrator of the Natio...
- Robert S. Okojie
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Material Damage System and Method for Determining Same
- Publication number 20170370692
- Publication date Dec 28, 2017
- Robert S. Okojie
- G01 - MEASURING TESTING

Robert S. Okojie

Person

Patents Grantslast 30 patents

On-chip integrated silicon carbide pressure and temperature sensors

Single conductor alloy as diffusion barrier system and simultaneous...

Diffusion barrier systems (DBS) for high temperature semiconductor...

Simultaneous ohmic contact to silicon carbide

Material damage system and method for determining same

Modular apparatus and method for attaching multiple devices

Single conductor alloy as diffusion barrier system and simulataneou...

Fabricating ultra-thin silicon carbide diaphragms

Material damage system and method for determining same

Dopant selective reactive ion etching of silicon carbide

Modular apparatus and method for attaching multiple devices

Dual ohmic contact to N- and P-type silicon carbide

MEMS direct chip attach packaging methodologies and apparatuses for...

MEMS direct chip attach packaging methodologies and apparatuses for...

Method of assembling a silicon carbide high temperature anemometer

Multi-functional micro electromechanical silicon carbide accelerometer

Multi-functional micro electromechanical devices and method of bulk...

Silicon carbide high temperature anemometer and method for assembli...

Method and apparatus for obtaining a precision thickness in semicon...

Patents Applicationslast 30 patents

Material Damage System and Method for Determining Same