Robert Sauer

Follow

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing integrated circuits
- Patent number 7,437,261
- Issue date Oct 14, 2008
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Grant
Event based IC test system
- Patent number 7,089,135
- Issue date Aug 8, 2006
- Advantest Corp.
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for supporting and manipulating a testhead in an automati...
- Patent number 6,771,062
- Issue date Aug 3, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Locking apparatus and loadboard assembly
- Patent number 6,747,447
- Issue date Jun 8, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Test head Hifix for semiconductor device testing apparatus
- Patent number 6,710,590
- Issue date Mar 23, 2004
- Advantest Corporation
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Grant
Test system emulator
- Patent number 5,951,704
- Issue date Sep 14, 1999
- Advantest Corp.
- Robert F. Sauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor test system
- Patent number 5,828,985
- Issue date Oct 27, 1998
- Advantest Corp.
- Robert F. Sauer
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for testing integrated circuits
- Publication number 20040225465
- Publication date Nov 11, 2004
- Advantest Corporation
- Ankan Pramanick
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system storing pin calibration data, commands an...
- Publication number 20040181731
- Publication date Sep 16, 2004
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Locking apparatus and loadboard assembly
- Publication number 20040056675
- Publication date Mar 25, 2004
- ADVANTEST CORPORATION
- Niels Markert
- G01 - MEASURING TESTING
Information Patent Application
Event based IC test system
- Publication number 20030217345
- Publication date Nov 20, 2003
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Architecture and design of universal IC test system
- Publication number 20030217341
- Publication date Nov 20, 2003
- Rochit Rajsuman
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor test system storing pin calibration data in non-volat...
- Publication number 20030110427
- Publication date Jun 12, 2003
- ADVANTEST CORPORATION
- Rochit Rajsuman
- G01 - MEASURING TESTING