Robert Silberstein

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for imaging of coated substrates
- Patent number 7,193,215
- Issue date Mar 20, 2007
- Northrop Grumman Corporation
- Don DiMarzio
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting structural defects and features utilizing blac...
- Patent number 7,164,146
- Issue date Jan 16, 2007
- Northrop Grumman Corporation
- John Douglas Weir
- G01 - MEASURING TESTING
Information Patent Grant
System and method for locating a source of a signal
- Patent number 6,828,937
- Issue date Dec 7, 2004
- Northrop Grumman Corporation
- Theodore William Hilgeman
- G01 - MEASURING TESTING
Information Patent Grant
Method of spectral nondestructive evaluation
- Patent number 6,184,528
- Issue date Feb 6, 2001
- Vought Aircraft Industries, Inc.
- Don DiMarzio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR IMAGING OF COATED SUBSTRATES
- Publication number 20070012877
- Publication date Jan 18, 2007
- Don DiMarzio
- G01 - MEASURING TESTING
Information Patent Application
System for detecting structural defects and features utilizing blac...
- Publication number 20060086912
- Publication date Apr 27, 2006
- Northrop Grumman Corporation
- John Douglas Weir
- G01 - MEASURING TESTING
Information Patent Application
System and method for imaging of coated substrates
- Publication number 20040026622
- Publication date Feb 12, 2004
- Don DiMarzio
- G01 - MEASURING TESTING