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ROBERT V. STACHNIK
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NEWARK, DE, US
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Patents Grants
last 30 patents
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Patent Grant
Apparatus and method for characterizing a replica tape
Patent number
9,207,174
Issue date
Dec 8, 2015
DeFelsko Corporation
Leon Vandervalk
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for characterizing a replica tape
Patent number
8,994,933
Issue date
Mar 31, 2015
DeFelsko Corporation
Leon Vandervalk
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE
Publication number
20150233826
Publication date
Aug 20, 2015
DEFELSKO CORPORATION
Leon VANDERVALK
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE
Publication number
20140192346
Publication date
Jul 10, 2014
DEFELSKO CORPORATION
Leon VANDERVALK
G01 - MEASURING TESTING