Robert W. Bassett

Follow

Person

Essex, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for automatically generating test patterns for at...
- Patent number 8,209,141
- Issue date Jun 26, 2012
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Grant
Parametric testing for high pin count ASIC
- Patent number 7,010,733
- Issue date Mar 7, 2006
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing integrated logic circuits
- Patent number 6,804,803
- Issue date Oct 12, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for hardware-assisted diagnosis of broken logi...
- Patent number 6,757,856
- Issue date Jun 29, 2004
- International Business Machines Corporation
- Robert W. Bassett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit driver inhibit control test method
- Patent number 5,127,008
- Issue date Jun 30, 1992
- International Business Machines Corporation
- Robert W. Bassett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Macro performance test
- Patent number 4,878,209
- Issue date Oct 31, 1989
- International Business Machines Corporation
- Robert W. Bassett
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY GENERATING TEST PATTERNS FOR AT...
- Publication number 20100235136
- Publication date Sep 16, 2010
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR COMPACT SCAN TESTING
- Publication number 20040139377
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Carl F. Barnhart
- G01 - MEASURING TESTING
Information Patent Application
Parametric testing for high pin count ASIC
- Publication number 20040073856
- Publication date Apr 15, 2004
- International Business Machines Corporation
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for hardware-assisted diagnosis of broken logi...
- Publication number 20030005363
- Publication date Jan 2, 2003
- Robert W. Bassett
- G01 - MEASURING TESTING
Information Patent Application
Method for testing integrated logic circuits
- Publication number 20020147559
- Publication date Oct 10, 2002
- Carl F. Barnhart
- G06 - COMPUTING CALCULATING COUNTING