Robert Wagner

Person

Neuburg am Inn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method and device for optically measuring the surface of a measurem...
- Patent number 11,125,550
- Issue date Sep 21, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Hannes Loferer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference plate and method for calibrating and/or checking a deflec...
- Patent number 11,092,432
- Issue date Aug 17, 2021
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Stephan Zweckinger
- G01 - MEASURING TESTING
Information Patent Grant
Method for capturing images of a preferably structured surface of a...
- Patent number 10,869,020
- Issue date Dec 15, 2020
- INB Vision AG.
- Wolfram Schmidt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for detecting an image of a preferably structured...
- Patent number 10,228,241
- Issue date Mar 12, 2019
- INB Vision AG.
- Hagen Wiest
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a thickness gauge
- Patent number 8,554,503
- Issue date Oct 8, 2013
- Micro-Epsilon Messetechnik GmbH
- Günter Schallmoser
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for the contactless optical determination of the...
- Patent number 8,064,686
- Issue date Nov 22, 2011
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for optically controlling the quality of objec...
- Patent number 7,576,849
- Issue date Aug 18, 2009
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Robert Wagner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20210364277
- Publication date Nov 25, 2021
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...
- Publication number 20200158498
- Publication date May 21, 2020
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Hannes LOFERER
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...
- Publication number 20190265026
- Publication date Aug 29, 2019
- MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
- Stephan ZWECKINGER
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING AN IMAGE OF A PREFERABLY STRUCTURED...
- Publication number 20180202801
- Publication date Jul 19, 2018
- Hagen WIEST
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CAPTURING IMAGES OF A PREFERABLY STRUCTURED SURFACE OF A...
- Publication number 20150324991
- Publication date Nov 12, 2015
- INB VISION AG
- Wolfram Schmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A THICKNESS GAUGE
- Publication number 20110125442
- Publication date May 26, 2011
- Günter Schallmoser
- G01 - MEASURING TESTING
Information Patent Application
Method and device for the contactless optical determination of the...
- Publication number 20070009149
- Publication date Jan 11, 2007
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for optically controlling the quality of objec...
- Publication number 20060072105
- Publication date Apr 6, 2006
- Micro-Epsilon Messtechnik GmbH & Co. KG
- Robert Wagner
- G01 - MEASURING TESTING

Robert Wagner

Person

Patents Grantslast 30 patents

Method and device for optically measuring the surface of a measurem...

Reference plate and method for calibrating and/or checking a deflec...

Method for capturing images of a preferably structured surface of a...

Device and method for detecting an image of a preferably structured...

Method for calibrating a thickness gauge

Method and device for the contactless optical determination of the...

Method and apparatus for optically controlling the quality of objec...

Patents Applicationslast 30 patents

METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...

METHOD AND DEVICE FOR OPTICALLY MEASURING THE SURFACE OF A MEASUREM...

REFERENCE PLATE AND METHOD FOR CALIBRATING AND/OR CHECKING A DEFLEC...

DEVICE AND METHOD FOR DETECTING AN IMAGE OF A PREFERABLY STRUCTURED...

METHOD FOR CAPTURING IMAGES OF A PREFERABLY STRUCTURED SURFACE OF A...

METHOD FOR CALIBRATING A THICKNESS GAUGE

Method and device for the contactless optical determination of the...

Method and apparatus for optically controlling the quality of objec...