Roberto Crippa

Person

Cernusco Lombardone, IT

People

Patents Grantslast 30 patents

Information Patent Grant
Testing head with an improved contact between contact probes and gu...
- Patent number 12,105,118
- Issue date Oct 1, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for electronic devices and corresponding probe card
- Patent number 12,032,003
- Issue date Jul 9, 2024
- Technoprobe, S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a multi-layer for a probe card
- Patent number 12,019,111
- Issue date Jun 25, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head with improved frequency property
- Patent number 11,828,774
- Issue date Nov 28, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,442,080
- Issue date Sep 13, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head for testing high-frequency devices
- Patent number 11,340,262
- Issue date May 24, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Interface element for a testing apparatus of electronic devices and...
- Patent number 11,293,941
- Issue date Apr 5, 2022
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe testing head with improved frequency properties
- Patent number 11,029,337
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe and relative probe head of an apparatus for testing e...
- Patent number 11,016,122
- Issue date May 25, 2021
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for electronics devices
- Patent number 10,782,319
- Issue date Sep 22, 2020
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Testing head comprising vertical probes
- Patent number 10,551,433
- Issue date Feb 4, 2020
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a semi-finished product comprising a plural...
- Patent number 10,365,299
- Issue date Jul 30, 2019
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe for a testing head
- Patent number 10,228,392
- Issue date Mar 12, 2019
- Technoprobe S.p.A.
- Roberto Crippa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-planarity probe card for a testing apparatus for electronic de...
- Patent number 10,151,775
- Issue date Dec 11, 2018
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Grant
Testing head of electronic devices
- Patent number 9,829,508
- Issue date Nov 28, 2017
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Testing head for a test equipment of electronic devices
- Patent number 9,429,593
- Issue date Aug 30, 2016
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES
- Publication number 20240044940
- Publication date Feb 8, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...
- Publication number 20240012025
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
- Publication number 20230324438
- Publication date Oct 12, 2023
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...
- Publication number 20230305054
- Publication date Sep 28, 2023
- TECHNOPROBE S.P.A.
- Riccardo VETTORI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A PROBE HEAD
- Publication number 20230288447
- Publication date Sep 14, 2023
- TECHNOPROBE S.P.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
A TESTING HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND...
- Publication number 20230029150
- Publication date Jan 26, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD FOR MANUFACTURING CONTACT PROBES FOR PROBE HEA...
- Publication number 20220155344
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Probe head for electronic devices and corresponding probe card
- Publication number 20220155348
- Publication date May 19, 2022
- Technoprobe, S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20210247422
- Publication date Aug 12, 2021
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD FOR TESTING HIGH-FREQUENCY DEVICES
- Publication number 20200271692
- Publication date Aug 27, 2020
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND...
- Publication number 20200200795
- Publication date Jun 25, 2020
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF A MULTI-LAYER FOR A PROBE CARD
- Publication number 20200072873
- Publication date Mar 5, 2020
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE TESTING HEAD WITH IMPROVED FREQUENCY PROPERTIES
- Publication number 20190377006
- Publication date Dec 12, 2019
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY
- Publication number 20190377005
- Publication date Dec 12, 2019
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...
- Publication number 20190293686
- Publication date Sep 26, 2019
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR ELECTRONIC DEVICES
- Publication number 20190113539
- Publication date Apr 18, 2019
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD COMPRISING VERTICAL PROBES
- Publication number 20180003767
- Publication date Jan 4, 2018
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING METHOD OF A SEMI-FINISHED PRODUCT COMPRISING A PLURAL...
- Publication number 20170299634
- Publication date Oct 19, 2017
- Technoprobe S.p.A.
- Giuseppe Crippa
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170269125
- Publication date Sep 21, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD AND CORRESPONDING MANUFACTURING ME...
- Publication number 20170122980
- Publication date May 4, 2017
- Technoprobe S.p.A.
- Roberto Crippa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
CONTACT PROBE FOR A TESTING HEAD
- Publication number 20170059612
- Publication date Mar 2, 2017
- Technoprobe S.p.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
HIGH-PLANARITY PROBE CARD FOR A TESTING APPARATUS FOR ELECTRONIC DE...
- Publication number 20160377655
- Publication date Dec 29, 2016
- Technoprobe S.p.A.
- Riccardo Liberini
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD OF ELECTRONIC DEVICES
- Publication number 20150309076
- Publication date Oct 29, 2015
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES
- Publication number 20120280703
- Publication date Nov 8, 2012
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING

Roberto Crippa

Person

Patents Grantslast 30 patents

Testing head with an improved contact between contact probes and gu...

Probe head for electronic devices and corresponding probe card

Manufacturing method of a multi-layer for a probe card

Probe head for reduced-pitch applications

Testing head with improved frequency property

Contact probe and relative probe head of an apparatus for testing e...

Contact probe for a testing head for testing high-frequency devices

Interface element for a testing apparatus of electronic devices and...

Vertical probe testing head with improved frequency properties

Contact probe and relative probe head of an apparatus for testing e...

Probe card for electronics devices

Testing head comprising vertical probes

Manufacturing method of a semi-finished product comprising a plural...

Contact probe for a testing head

High-planarity probe card for a testing apparatus for electronic de...

Testing head of electronic devices

Testing head for a test equipment of electronic devices

Patents Applicationslast 30 patents

CONTACT PROBE FOR PROBE HEADS OF ELECTRONIC DEVICES

IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...

TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY

PROBE HEAD FOR TESTING ELECTRONIC DEVICES COMPRISING INTEGRATED OPT...

CONTACT PROBE FOR A PROBE HEAD

A TESTING HEAD WITH AN IMPROVED CONTACT BETWEEN CONTACT PROBES AND...

PROBE HEAD FOR REDUCED-PITCH APPLICATIONS

MANUFACTURING METHOD FOR MANUFACTURING CONTACT PROBES FOR PROBE HEA...

Probe head for electronic devices and corresponding probe card

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

CONTACT PROBE FOR A TESTING HEAD FOR TESTING HIGH-FREQUENCY DEVICES

INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND...

MANUFACTURING METHOD OF A MULTI-LAYER FOR A PROBE CARD

VERTICAL PROBE TESTING HEAD WITH IMPROVED FREQUENCY PROPERTIES

TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY

CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING E...

PROBE CARD FOR ELECTRONIC DEVICES

TESTING HEAD COMPRISING VERTICAL PROBES

MANUFACTURING METHOD OF A SEMI-FINISHED PRODUCT COMPRISING A PLURAL...

CONTACT PROBE FOR A TESTING HEAD

CONTACT PROBE FOR A TESTING HEAD AND CORRESPONDING MANUFACTURING ME...

CONTACT PROBE FOR A TESTING HEAD

HIGH-PLANARITY PROBE CARD FOR A TESTING APPARATUS FOR ELECTRONIC DE...

TESTING HEAD OF ELECTRONIC DEVICES

TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES