Robin Anne Sacco

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Franklin, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for simultaneously measuring multiple properties...
- Patent number 6,393,915
- Issue date May 28, 2002
- Koninklijke Philips Electronics N.V.
- Matthew John Banet
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thickness of films
- Patent number 6,122,064
- Issue date Sep 19, 2000
- Philips Electronics North America Corporation
- Matt John Banet
- G01 - MEASURING TESTING