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Robin B. Runck
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Sherman Oaks, CA, US
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last 30 patents
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Patent Grant
Capacitance-type material level indicator
Patent number
4,499,767
Issue date
Feb 19, 1985
Berwind Corporation
George H. Fathauer
G01 - MEASURING TESTING
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Patent Grant
Method of manufacturing capacitance-type material level indicator p...
Patent number
4,499,640
Issue date
Feb 19, 1985
Berwind Corporation
Ronald G. Brenton
G01 - MEASURING TESTING