Robin MAIR

Person

West Chicago, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-destructive inspection and manufacturing metrology systems and...
- Patent number 12,092,565
- Issue date Sep 17, 2024
- Onto Innovation Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of patterned structures using acoustic metrology
- Patent number 11,988,641
- Issue date May 21, 2024
- Onto Innovation Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Grant
Opto-acoustic measurement of a transparent film stack
- Patent number 11,668,644
- Issue date Jun 6, 2023
- Onto Innovation Inc.
- George Andrew Antonelli
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive acoustic metrology for void detection
- Patent number 9,991,176
- Issue date Jun 5, 2018
- Rudolph Technologies, Inc.
- Manjusha Mehendale
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical acoustic substrate assessment system and method
- Patent number 9,576,862
- Issue date Feb 21, 2017
- Rudolph Technologies, Inc.
- Todd Murray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,705,974
- Issue date Apr 27, 2010
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,522,272
- Issue date Apr 21, 2009
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,253,887
- Issue date Aug 7, 2007
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Patent number 7,006,221
- Issue date Feb 28, 2006
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...
- Publication number 20240402074
- Publication date Dec 5, 2024
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
MULTI PUMP-PROBE ENCODING-DECODING FOR OPTO-ACOUSTIC METROLOGY
- Publication number 20240329005
- Publication date Oct 3, 2024
- ONTO INNOVATION INC.
- Michael J. Kotelyanskii
- G01 - MEASURING TESTING
Information Patent Application
A SYSTEM AND METHOD FOR PERFORMING ALIGNMENT AND OVERLAY MEASUREMEN...
- Publication number 20240004311
- Publication date Jan 4, 2024
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTO-ACOUSTIC MEASUREMENT OF A TRANSPARENT FILM STACK
- Publication number 20220317025
- Publication date Oct 6, 2022
- ONTO INNOVATION INC.
- George Andrew Antonelli
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...
- Publication number 20220228973
- Publication date Jul 21, 2022
- ONTO INNOVATION INC.
- Manjusha MEHENDALE
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZATION OF PATTERNED STRUCTURES USING ACOUSTIC METROLOGY
- Publication number 20210318270
- Publication date Oct 14, 2021
- ONTO INNOVATION INC.
- Manjusha Mehendale
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE ACOUSTIC METROLOGY FOR VOID DETECTION
- Publication number 20170221778
- Publication date Aug 3, 2017
- The Regents of the University of Colorado
- Manjusha MEHENDALE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD
- Publication number 20160043008
- Publication date Feb 11, 2016
- Todd MURRAY
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20090201502
- Publication date Aug 13, 2009
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20070268478
- Publication date Nov 22, 2007
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20060126057
- Publication date Jun 15, 2006
- Rudolph Technologies, Inc.
- Robert Gregory Wolf
- G01 - MEASURING TESTING
Information Patent Application
Metrology system with spectroscopic ellipsometer and photoacoustic...
- Publication number 20030076497
- Publication date Apr 24, 2003
- Robert Gregory Wolf
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Non-destructive inspection and manufacturing metrology systems and...

Characterization of patterned structures using acoustic metrology

Opto-acoustic measurement of a transparent film stack

Non-destructive acoustic metrology for void detection

Optical acoustic substrate assessment system and method

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Patents Applicationslast 30 patents

NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...

MULTI PUMP-PROBE ENCODING-DECODING FOR OPTO-ACOUSTIC METROLOGY

A SYSTEM AND METHOD FOR PERFORMING ALIGNMENT AND OVERLAY MEASUREMEN...

OPTO-ACOUSTIC MEASUREMENT OF A TRANSPARENT FILM STACK

NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND...

CHARACTERIZATION OF PATTERNED STRUCTURES USING ACOUSTIC METROLOGY

NON-DESTRUCTIVE ACOUSTIC METROLOGY FOR VOID DETECTION

OPTICAL ACOUSTIC SUBSTRATE ASSESSMENT SYSTEM AND METHOD

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...

Metrology system with spectroscopic ellipsometer and photoacoustic...