Rodger F. Schuttert

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Emulation and debug interfaces for testing an integrated circuit wi...
- Patent number 9,838,165
- Issue date Dec 5, 2017
- NXP B.V.
- Rodger F. Schuttert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for on-chip jitter injection
- Patent number 8,169,225
- Issue date May 1, 2012
- NXP B.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Grant
Circuit interconnect testing arrangement and approach therefor
- Patent number 7,685,488
- Issue date Mar 23, 2010
- NXP B.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Grant
Analog IC having test arrangement and test method for such an IC
- Patent number 7,671,618
- Issue date Mar 2, 2010
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Testing of electronic circuits
- Patent number 7,447,963
- Issue date Nov 4, 2008
- NXP B.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Grant
Boundary scan circuit with integrated sensor for sensing physical o...
- Patent number 7,380,186
- Issue date May 27, 2008
- NXP B.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with power supply test interface
- Patent number 6,812,690
- Issue date Nov 2, 2004
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit and test method for protecting an IC against damage fr...
- Patent number 6,765,403
- Issue date Jul 20, 2004
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with test interface
- Patent number 6,664,798
- Issue date Dec 16, 2003
- Koninklijke Philips Electronics N.V.
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Connection test method
- Patent number 6,297,643
- Issue date Oct 2, 2001
- U.S. Philips Corporation
- Franciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Testable circuit
- Patent number 5,781,559
- Issue date Jul 14, 1998
- U.S. Philips Corporation
- Mathias N. M. Muris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ON-CHIP JITTER INJECTION
- Publication number 20100026314
- Publication date Feb 4, 2010
- Koninklijke Philips Electronics N.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Application
ANALOG IC HAVING TEST ARRANGEMENT AND TEST METHOD FOR SUCH AN IC
- Publication number 20090134904
- Publication date May 28, 2009
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
EMULATION AND DEBUG INTERFACES FOR TESTING AN INTEGRATED CIRCUIT WI...
- Publication number 20090105978
- Publication date Apr 23, 2009
- NXP B.V.
- Rodger F. Schuttert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR
- Publication number 20090077438
- Publication date Mar 19, 2009
- Koninklijke Philips Electronics N.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Application
Testing of electronic circuits
- Publication number 20060150042
- Publication date Jul 6, 2006
- Koninklijke Philips Electronics N.V.
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Application
Boundary scan circuit with integrated sensor for sensing physical o...
- Publication number 20060136165
- Publication date Jun 22, 2006
- Koninklijke Philips Electronics N.V., a corporatio
- Rodger Frank Schuttert
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with power supply test interface
- Publication number 20020153876
- Publication date Oct 24, 2002
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
Test circuit and test method
- Publication number 20020149387
- Publication date Oct 17, 2002
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with test interface
- Publication number 20010015653
- Publication date Aug 23, 2001
- U.S. PHILIPS CORPORATION
- Franciscus Gerardus Maria De Jong
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION TEST METHOD
- Publication number 20010013781
- Publication date Aug 16, 2001
- FRANCISCUS G.M. DE JONG
- G01 - MEASURING TESTING

Rodger F. Schuttert

Person

Patents Grantslast 30 patents

Emulation and debug interfaces for testing an integrated circuit wi...

System and method for on-chip jitter injection

Circuit interconnect testing arrangement and approach therefor

Analog IC having test arrangement and test method for such an IC

Testing of electronic circuits

Boundary scan circuit with integrated sensor for sensing physical o...

Integrated circuit with power supply test interface

Test circuit and test method for protecting an IC against damage fr...

Integrated circuit with test interface

Connection test method

Testable circuit

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR ON-CHIP JITTER INJECTION

ANALOG IC HAVING TEST ARRANGEMENT AND TEST METHOD FOR SUCH AN IC

EMULATION AND DEBUG INTERFACES FOR TESTING AN INTEGRATED CIRCUIT WI...

CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR

Testing of electronic circuits

Boundary scan circuit with integrated sensor for sensing physical o...

Integrated circuit with power supply test interface

Test circuit and test method

Integrated circuit with test interface

CONNECTION TEST METHOD