Rodney Browen

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for selecting test point nodes of a group of c...
- Patent number 6,467,051
- Issue date Oct 15, 2002
- Agilent Technologies, Inc.
- Rodney A. Browen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electronic circuit model correction
- Patent number 6,334,100
- Issue date Dec 25, 2001
- Agilent Technologies, Inc.
- Cherif Ahrikencheikh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for board model correction
- Patent number 6,327,545
- Issue date Dec 4, 2001
- Agilent Technologies, Inc.
- Rodney A. Browen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for selecting stimulus locations during limite...
- Patent number 6,266,787
- Issue date Jul 24, 2001
- Agilent Technologies, Inc.
- John E. McDermid
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for selecting targeted components in limited a...
- Patent number 6,263,476
- Issue date Jul 17, 2001
- Agilent Technologies
- Rodney A. Browen
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for correcting for detector inaccuracies in li...
- Patent number 6,237,118
- Issue date May 22, 2001
- Agilent Technologies
- Cherif Ahrikencheikh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for limited access circuit test
- Patent number 6,233,706
- Issue date May 15, 2001
- Agilent Technologies
- Cherif Ahrikencheikh
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing utilizing data compression and derivative mode vectors
- Patent number 4,652,814
- Issue date Mar 24, 1987
- Hewlett-Packard Company
- William A. Groves
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tester having on-the-fly comparison of actual and expected...
- Patent number 4,642,561
- Issue date Feb 10, 1987
- Hewlett-Packard Company
- William A. Groves
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tester having indirect counters
- Patent number 4,598,245
- Issue date Jul 1, 1986
- Hewlett-Packard Company
- William A. Groves
- G01 - MEASURING TESTING

Rodney Browen

Person

Patents Grantslast 30 patents

Method and apparatus for selecting test point nodes of a group of c...

Method and apparatus for electronic circuit model correction

Method and apparatus for board model correction

Method and apparatus for selecting stimulus locations during limite...

Method and apparatus for selecting targeted components in limited a...

Method and apparatus for correcting for detector inaccuracies in li...

Method and apparatus for limited access circuit test

Circuit testing utilizing data compression and derivative mode vectors

Circuit tester having on-the-fly comparison of actual and expected...

Circuit tester having indirect counters