Rodney L. Kirstine

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Caldwell, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measurement of thickness and warpage of su...
- Patent number 7,328,517
- Issue date Feb 12, 2008
- Micron Technology, Inc.
- Rodney L. Kirstine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of thickness and warpage of su...
- Patent number 7,131,211
- Issue date Nov 7, 2006
- Micron Technology, Inc.
- Rodney L. Kirstine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measurement of thickness and warpage of su...
- Publication number 20070022618
- Publication date Feb 1, 2007
- Rodney L. Kirstine
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measurement of thickness and warpage of su...
- Publication number 20050039342
- Publication date Feb 24, 2005
- Rodney L. Kirstine
- G01 - MEASURING TESTING