Roel Daamen

Person

Herkenbosch, NL

People

Patents Grantslast 30 patents

Information Patent Grant
CMOS compatible dew point sensor device and method of determining a...
- Patent number 11,525,793
- Issue date Dec 13, 2022
- Sciosense B.V.
- Dimitri Soccol
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor module
- Patent number 11,293,821
- Issue date Apr 5, 2022
- Sciosense B.V.
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
CMOS-compatible dew point sensor device and method of determining a...
- Patent number 11,002,696
- Issue date May 11, 2021
- Sciosense B.V.
- Dimitri Soccol
- G01 - MEASURING TESTING
Information Patent Grant
Sensor semiconductor device and method of producing a sensor semico...
- Patent number 10,475,716
- Issue date Nov 12, 2019
- AMS AG
- Nebojsa Nenadovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 10,197,520
- Issue date Feb 5, 2019
- AMS International AG
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Package for environmental parameter sensors and method for manufact...
- Patent number 10,192,842
- Issue date Jan 29, 2019
- AMS International AG
- Hendrik Bouman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a device with a cavity
- Patent number 10,171,007
- Issue date Jan 1, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Greja Johanna Adriana Maria Verheijden
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,941,222
- Issue date Apr 10, 2018
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electronic lateral flow test arrangement and method
- Patent number 9,921,228
- Issue date Mar 20, 2018
- NXP B.V.
- Viet Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Breach sensor
- Patent number 9,891,183
- Issue date Feb 13, 2018
- NXP B.V.
- Roel Daamen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Food package with integrated RFID-tag and sensor
- Patent number 9,884,715
- Issue date Feb 6, 2018
- NXP B.V.
- Romano Hoofman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Integrated circuit comprising a gas sensor
- Patent number 9,865,647
- Issue date Jan 9, 2018
- ams International AG
- Aurelie Humbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip structure
- Patent number 9,862,600
- Issue date Jan 9, 2018
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micro-device with a cavity
- Patent number 9,859,818
- Issue date Jan 2, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Greja Johanna Adriana Maria Verheijden
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,818,905
- Issue date Nov 14, 2017
- NXP B.V.
- Aurelie Humbert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,766,195
- Issue date Sep 19, 2017
- ams International AG
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with an integrated heat sink array
- Patent number 9,666,598
- Issue date May 30, 2017
- NXP B.V.
- Liang Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and manufacturing method therefor
- Patent number 9,632,049
- Issue date Apr 25, 2017
- ams International AG
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Grant
Sensor
- Patent number 9,546,884
- Issue date Jan 17, 2017
- NXP B.V.
- Roel Daamen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit comprising a gas sensor
- Patent number 9,523,651
- Issue date Dec 20, 2016
- ams International AG
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with heat sinks
- Patent number 9,508,693
- Issue date Nov 29, 2016
- NXP B.V.
- Liang Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermal conductivity gas sensor with amplification material
- Patent number 9,453,807
- Issue date Sep 27, 2016
- ams International AG
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit including a directional light sensor
- Patent number 9,419,043
- Issue date Aug 16, 2016
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit comprising a thermal conductivity based gas sensor
- Patent number 9,372,166
- Issue date Jun 21, 2016
- ams International AG
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,284,187
- Issue date Mar 15, 2016
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Biocompatible electrodes and methods of manufacturing biocompatible...
- Patent number 9,281,239
- Issue date Mar 8, 2016
- NXP B.V.
- Roel Daamen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit comprising a gas sensor
- Patent number 9,263,500
- Issue date Feb 16, 2016
- ams International AG
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,188,540
- Issue date Nov 17, 2015
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with sensor and method of manufacturing such an...
- Patent number 9,070,695
- Issue date Jun 30, 2015
- NXP, B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and manufacturing method
- Patent number 9,052,267
- Issue date Jun 9, 2015
- NXP, B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CMOS Compatible Dew Point Sensor Device and Method of Determining a...
- Publication number 20210223193
- Publication date Jul 22, 2021
- Sciosense B.V.
- Dimitri Soccol
- G01 - MEASURING TESTING
Information Patent Application
Pressure Sensor Module
- Publication number 20210055177
- Publication date Feb 25, 2021
- ams AG
- Roel DAAMEN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CMOS-COMPATIBLE DEW POINT SENSOR DEVICE AND METHOD OF DETERMINING A...
- Publication number 20190094164
- Publication date Mar 28, 2019
- ams AG
- Dimitri SOCCOL
- G01 - MEASURING TESTING
Information Patent Application
A SENSOR SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING A SENSOR SEMI...
- Publication number 20180331007
- Publication date Nov 15, 2018
- Nebojsa NENADOVIC
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing a Device with a Cavity
- Publication number 20180109203
- Publication date Apr 19, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Greja Johanna Adriana Maria Verheijden
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
BREACH SENSOR
- Publication number 20170010232
- Publication date Jan 12, 2017
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
CHIP STRUCTURE
- Publication number 20160340180
- Publication date Nov 24, 2016
- ams International AG
- Roel Daamen
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20160197047
- Publication date Jul 7, 2016
- ams International AG
- Roel DAAMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A GAS SENSOR
- Publication number 20160163766
- Publication date Jun 9, 2016
- ams International AG
- Aurelie HUMBERT
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20160043265
- Publication date Feb 11, 2016
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
Gas Sensor
- Publication number 20150285750
- Publication date Oct 8, 2015
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
SENSOR PACKAGE AND MANUFACTURING METHOD
- Publication number 20150171042
- Publication date Jun 18, 2015
- NXP B.V.
- Hendrik Bouman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150123200
- Publication date May 7, 2015
- NXP B.V.
- Liang Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150123241
- Publication date May 7, 2015
- NXP B.V.
- Liang Yan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A DEVICE WITH A CAVITY
- Publication number 20150091411
- Publication date Apr 2, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Greja Johanna Adriana Maria Verheijden
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20150031158
- Publication date Jan 29, 2015
- NXP B.V.
- Youri Victorovitch Ponomarev
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC LATERAL FLOW TEST ARRANGEMENT AND METHOD
- Publication number 20140323350
- Publication date Oct 30, 2014
- NXP B.V.
- Viet Nguyen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT INCLUDING A DIRECTIONAL LIGHT SENSOR
- Publication number 20140203391
- Publication date Jul 24, 2014
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT AND MANUFACTURING METHOD
- Publication number 20140191348
- Publication date Jul 10, 2014
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
BIOSENSOR MODULE COMPRISING A BIOCOMPATIBLE ELECTRODE
- Publication number 20140151221
- Publication date Jun 5, 2014
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
MIM-CAPACITOR AND METHOD OF MANUFACTURING SAME
- Publication number 20140145297
- Publication date May 29, 2014
- NXP B.V.
- Roel DAAMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A THERMAL CONDUCTIVITY BASED GAS SENSOR
- Publication number 20140102172
- Publication date Apr 17, 2014
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A GAS SENSOR
- Publication number 20140070825
- Publication date Mar 13, 2014
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT COMPRISING A GAS SENSOR
- Publication number 20130256825
- Publication date Oct 3, 2013
- NXP B.V.
- Aurelie HUMBERT
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20130069176
- Publication date Mar 21, 2013
- NXP B.V.
- Roel DAAMEN
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing a Device with a Cavity
- Publication number 20130069178
- Publication date Mar 21, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Greja Johanna Adriana Maria Verheijden
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20130032903
- Publication date Feb 7, 2013
- NXP B.V.
- Matthias Merz
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...
- Publication number 20120299126
- Publication date Nov 29, 2012
- NXP B.V.
- Roel Daamen
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20120260732
- Publication date Oct 18, 2012
- NXP B.V.
- Aurelie Humbert
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD
- Publication number 20120256645
- Publication date Oct 11, 2012
- NXP B.V.
- Viet Hoang Nguyen
- G01 - MEASURING TESTING

Roel Daamen

Person

Patents Grantslast 30 patents

CMOS compatible dew point sensor device and method of determining a...

Pressure sensor module

CMOS-compatible dew point sensor device and method of determining a...

Sensor semiconductor device and method of producing a sensor semico...

Integrated circuit with sensor and method of manufacturing such an...

Package for environmental parameter sensors and method for manufact...

Method of manufacturing a device with a cavity

Integrated circuit with sensor and method of manufacturing such an...

Electronic lateral flow test arrangement and method

Breach sensor

Food package with integrated RFID-tag and sensor

Integrated circuit comprising a gas sensor

Chip structure

Micro-device with a cavity

Integrated circuit and manufacturing method

Integrated circuit with sensor and method of manufacturing such an...

Semiconductor device with an integrated heat sink array

Integrated circuit and manufacturing method therefor

Sensor

Integrated circuit comprising a gas sensor

Semiconductor device with heat sinks

Thermal conductivity gas sensor with amplification material

Integrated circuit including a directional light sensor

Integrated circuit comprising a thermal conductivity based gas sensor

Integrated circuit with sensor and method of manufacturing such an...

Biocompatible electrodes and methods of manufacturing biocompatible...

Integrated circuit comprising a gas sensor

Integrated circuit and manufacturing method

Integrated circuit with sensor and method of manufacturing such an...

Integrated circuit and manufacturing method

Patents Applicationslast 30 patents

CMOS Compatible Dew Point Sensor Device and Method of Determining a...

Pressure Sensor Module

CMOS-COMPATIBLE DEW POINT SENSOR DEVICE AND METHOD OF DETERMINING A...

A SENSOR SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING A SENSOR SEMI...

Method of Manufacturing a Device with a Cavity

BREACH SENSOR

CHIP STRUCTURE

INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...

INTEGRATED CIRCUIT COMPRISING A GAS SENSOR

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

Gas Sensor

SENSOR PACKAGE AND MANUFACTURING METHOD

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING A DEVICE WITH A CAVITY

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

ELECTRONIC LATERAL FLOW TEST ARRANGEMENT AND METHOD

INTEGRATED CIRCUIT INCLUDING A DIRECTIONAL LIGHT SENSOR

INTEGRATED CIRCUIT AND MANUFACTURING METHOD

BIOSENSOR MODULE COMPRISING A BIOCOMPATIBLE ELECTRODE

MIM-CAPACITOR AND METHOD OF MANUFACTURING SAME

INTEGRATED CIRCUIT COMPRISING A THERMAL CONDUCTIVITY BASED GAS SENSOR

INTEGRATED CIRCUIT COMPRISING A GAS SENSOR

INTEGRATED CIRCUIT COMPRISING A GAS SENSOR

INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...

Method of Manufacturing a Device with a Cavity

INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...

INTEGRATED CIRCUIT WITH SENSOR AND METHOD OF MANUFACTURING SUCH AN...

SENSOR

CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD