Roelof De Lange

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus comprising an adjustable slit diaphragm
- Patent number 5,115,460
- Issue date May 19, 1992
- U.S. Philips Corp.
- Roelof De Lange
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Examination of material samples
- Publication number 20040234029
- Publication date Nov 25, 2004
- Roelof De Lange
- G01 - MEASURING TESTING