Roger Alvis

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for wafer defect inspection
- Patent number 11,513,079
- Issue date Nov 29, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tomography-assisted TEM prep with requested intervention automation...
- Patent number 11,004,651
- Issue date May 11, 2021
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography-assisted TEM prep with requested intervention automation...
- Patent number 10,453,646
- Issue date Oct 22, 2019
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of a malleable lamella for correlative atomic-resolutio...
- Patent number 9,797,923
- Issue date Oct 24, 2017
- FEI Company
- Roger Alvis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR WAFER DEFECT INSPECTION
- Publication number 20220113262
- Publication date Apr 14, 2022
- FEI Company
- Roger Alvis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...
- Publication number 20200027692
- Publication date Jan 23, 2020
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY-ASSISTED TEM PREP WITH REQUESTED INTERVENTION AUTOMATION...
- Publication number 20190139735
- Publication date May 9, 2019
- FEI Company
- Roger Louis Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication of a Malleable Lamella for Correlative Atomic-Resolutio...
- Publication number 20150253353
- Publication date Sep 10, 2015
- FEI Company
- Roger Alvis
- G01 - MEASURING TESTING