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Roger Bourree
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Cedar Hill, TX, US
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last 30 patents
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Patent Grant
Method and apparatus for analyzing particulate matter
Patent number
5,983,735
Issue date
Nov 16, 1999
MWI, Inc.
Wieland E. Von Behrens
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for analyzing particulate matter
Patent number
5,895,869
Issue date
Apr 20, 1999
MWI, Inc.
Wieland E. Von Behrens
G01 - MEASURING TESTING