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Roger C. Callahan
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Goleta, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Material property measurements using multiple frequency atomic forc...
Patent number
10,215,773
Issue date
Feb 26, 2019
Oxford Instruments AFM Inc
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Automated atomic force microscope and the operation thereof
Patent number
9,921,242
Issue date
Mar 20, 2018
Oxford Instruments Asylum Research Inc
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Automated atomic force microscope and the operation thereof
Patent number
9,383,388
Issue date
Jul 5, 2016
Oxford Instruments Asylum Research, Inc.
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Variable density scanning
Patent number
9,366,693
Issue date
Jun 14, 2016
Oxford Instruments PLC
Roger B Proksch
G01 - MEASURING TESTING
Information
Patent Grant
Material property measurements using multiple frequency atomic fore...
Patent number
8,555,711
Issue date
Oct 15, 2013
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Variable density scanning
Patent number
8,489,356
Issue date
Jul 16, 2013
Oxford Instruments, PLC
Roger B. Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Material property measurements using multiple frequency atomic forc...
Patent number
8,024,963
Issue date
Sep 27, 2011
Asylum Research Corporation
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Variable density scanning
Patent number
7,941,286
Issue date
May 10, 2011
Asylum Research Corporation
Roger B. Proksch
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
Publication number
20190195910
Publication date
Jun 27, 2019
OXFORD INSTRUMENTS PLC
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Automated Atomic Force Microscope and the Operation Thereof
Publication number
20160313369
Publication date
Oct 27, 2016
Oxford Instruments Asylum Research, Inc.
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
Publication number
20160258980
Publication date
Sep 8, 2016
OXFORD INSTRUMENTS PLC
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Variable Density Scanning
Publication number
20150377920
Publication date
Dec 31, 2015
Oxford Instruments Asylum Research Corporation
Roger B. Proksch
G01 - MEASURING TESTING
Information
Patent Application
Automated Atomic Force Microscope and the Operation Thereof
Publication number
20150301080
Publication date
Oct 22, 2015
Oxford Instruments Asylum Research, Inc.
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Variable Density Scanning
Publication number
20150026846
Publication date
Jan 22, 2015
OXFORD INSTRUMENTS AFM INC
Roger B. Proksch
G01 - MEASURING TESTING
Information
Patent Application
Material Property Measurements Using Multiple Frequency Atomic Fore...
Publication number
20140041084
Publication date
Feb 6, 2014
Oxford Instruments AFM, Inc
Roger Proksch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Material Property Measurements Using Multiple Frequency Atomic Fore...
Publication number
20120079631
Publication date
Mar 29, 2012
ASYLUM RESEARCH CORPORATION
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
Variable Density Scanning
Publication number
20110219479
Publication date
Sep 8, 2011
ASYLUM RESEARCH CORPORATION
Roger B. Proksch
G01 - MEASURING TESTING
Information
Patent Application
Material property measurements using multiple frequency atomic forc...
Publication number
20090013770
Publication date
Jan 15, 2009
Roger Proksch
G01 - MEASURING TESTING
Information
Patent Application
VARIABLE DENSITY SCANNING
Publication number
20070176101
Publication date
Aug 2, 2007
Roger B. Proksch
G01 - MEASURING TESTING