Roger Carlos Proksch

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metrological scanning probe microscope
- Patent number RE49997
- Issue date Jun 4, 2024
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,705,114
- Issue date Jul 7, 2020
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 10,556,793
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 10,557,865
- Issue date Feb 11, 2020
- Oxford Instruments Asylum Research, Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AM/FM measurements using multiple frequency atomic force microscopy
- Patent number 10,444,258
- Issue date Oct 15, 2019
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 10,337,890
- Issue date Jul 2, 2019
- Oxford Instruments AFM Inc.
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 10,338,096
- Issue date Jul 2, 2019
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Material property measurements using multiple frequency atomic forc...
- Patent number 10,215,773
- Issue date Feb 26, 2019
- Oxford Instruments AFM Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 10,107,832
- Issue date Oct 23, 2018
- Oxford Instruments PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 10,054,612
- Issue date Aug 21, 2018
- Oxford Instruments Asylum Research Inc
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,921,242
- Issue date Mar 20, 2018
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,841,436
- Issue date Dec 12, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Metrological scanning probe microscope
- Patent number 9,804,193
- Issue date Oct 31, 2017
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 9,696,342
- Issue date Jul 4, 2017
- Oxford Instruments AFM Inc.
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 9,689,890
- Issue date Jun 27, 2017
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal measurements using multiple frequency atomic force microscopy
- Patent number 9,604,846
- Issue date Mar 28, 2017
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated micro actuator and LVDT for high precision position meas...
- Patent number 9,518,814
- Issue date Dec 13, 2016
- Oxford Instruments Asylum Research Inc
- Roger Proksch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
AM/FM measurements using multiple frequency of atomic force microscopy
- Patent number 9,453,857
- Issue date Sep 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Automated atomic force microscope and the operation thereof
- Patent number 9,383,388
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Optical beam positioning unit for atomic force microscope
- Patent number 9,383,386
- Issue date Jul 5, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Grant
Variable density scanning
- Patent number 9,366,693
- Issue date Jun 14, 2016
- Oxford Instruments PLC
- Roger B Proksch
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative measurements using multiple frequency atomic force mic...
- Patent number 9,297,827
- Issue date Mar 29, 2016
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,097,737
- Issue date Aug 4, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Multiple frequency atomic force microscopy
- Patent number 9,069,007
- Issue date Jun 30, 2015
- Oxford Instruments PLC
- Roger B Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 9,063,042
- Issue date Jun 23, 2015
- Oxford Instruments PLC
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transducer assembly with digitally created signals
- Patent number 9,024,623
- Issue date May 5, 2015
- Oxford Instruments PLC
- Dan Bocek
- G01 - MEASURING TESTING
Information Patent Grant
Fully digitally controller for cantilever-based instruments
- Patent number 8,925,376
- Issue date Jan 6, 2015
- Oxford Instruments PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Active damping of high speed scanning probe microscope components
- Patent number 8,763,475
- Issue date Jul 1, 2014
- Oxford Instruments Asylum Research Corporation
- Roger Proksch
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...

Patents Applicationslast 30 patents

Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20190324054
- Publication date Oct 24, 2019
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
- Publication number 20190195910
- Publication date Jun 27, 2019
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY
- Publication number 20180292432
- Publication date Oct 11, 2018
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20180128853
- Publication date May 10, 2018
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20170313583
- Publication date Nov 2, 2017
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20170299628
- Publication date Oct 19, 2017
- Oxford Instruments AFM Inc
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20170292971
- Publication date Oct 12, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20170254834
- Publication date Sep 7, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20170168089
- Publication date Jun 15, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20170131322
- Publication date May 11, 2017
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20170089733
- Publication date Mar 30, 2017
- OXFORD INSTRUMENTS PLC
- Roger Carlos Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20160313369
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Optical Beam Positioning Unit for Atomic Force Microscope
- Publication number 20160313368
- Publication date Oct 27, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...
- Publication number 20160282384
- Publication date Sep 29, 2016
- Oxford Instruments AFM Inc
- Roger B Proksch
- G01 - MEASURING TESTING
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Forc...
- Publication number 20160258980
- Publication date Sep 8, 2016
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Metrological Scanning Probe Microscope
- Publication number 20160169937
- Publication date Jun 16, 2016
- Oxford Instruments Asylum Research, Inc.
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Variable Density Scanning
- Publication number 20150377920
- Publication date Dec 31, 2015
- Oxford Instruments Asylum Research Corporation
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope with Environmental Controls
- Publication number 20150338438
- Publication date Nov 26, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy
- Publication number 20150309071
- Publication date Oct 29, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Automated Atomic Force Microscope and the Operation Thereof
- Publication number 20150301080
- Publication date Oct 22, 2015
- Oxford Instruments Asylum Research, Inc.
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Modular atomic force microscope with environmental controls
- Publication number 20150150163
- Publication date May 28, 2015
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Application
Fully Digitally Controller for Cantilever-Based Instruments
- Publication number 20150113687
- Publication date Apr 23, 2015
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Variable Density Scanning
- Publication number 20150026846
- Publication date Jan 22, 2015
- OXFORD INSTRUMENTS AFM INC
- Roger B. Proksch
- G01 - MEASURING TESTING
Information Patent Application
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy
- Publication number 20150013037
- Publication date Jan 8, 2015
- ASYLUM RESEARCH CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE
- Publication number 20140317790
- Publication date Oct 23, 2014
- Aleksander Labuda
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20140223612
- Publication date Aug 7, 2014
- ASYLUM CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Material Property Measurements Using Multiple Frequency Atomic Fore...
- Publication number 20140041084
- Publication date Feb 6, 2014
- Oxford Instruments AFM, Inc
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiple Frequency Atomic Force Microscopy
- Publication number 20130340126
- Publication date Dec 19, 2013
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Integrated Micro Actuator and LVDT for High Precision Position Meas...
- Publication number 20130314078
- Publication date Nov 28, 2013
- OXFORD INSTRUMENTS AFM INC
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Quantitative measurements using multiple frequency atomic force mic...
- Publication number 20130117895
- Publication date May 9, 2013
- ASYLUM RESEARCH CORPORATION
- Roger B. Proksch
- B82 - NANO-TECHNOLOGY

Roger Carlos Proksch

Person

Patents Grantslast 30 patents

Metrological scanning probe microscope

Metrological scanning probe microscope

Thermal measurements using multiple frequency atomic force microscopy

Quantitative measurements using multiple frequency atomic force mic...

AM/FM measurements using multiple frequency atomic force microscopy

Modular atomic force microscope with environmental controls

Integrated micro actuator and LVDT for high precision position meas...

Metrological scanning probe microscope

Material property measurements using multiple frequency atomic forc...

Fully digitally controller for cantilever-based instruments

Optical beam positioning unit for atomic force microscope

Automated atomic force microscope and the operation thereof

AM/FM measurements using multiple frequency of atomic force microscopy

Metrological scanning probe microscope

Quantitative measurements using multiple frequency atomic force mic...

Fully digitally controller for cantilever-based instruments

Thermal measurements using multiple frequency atomic force microscopy

Modular atomic force microscope with environmental controls

Integrated micro actuator and LVDT for high precision position meas...

AM/FM measurements using multiple frequency of atomic force microscopy

Automated atomic force microscope and the operation thereof

Optical beam positioning unit for atomic force microscope

Variable density scanning

Quantitative measurements using multiple frequency atomic force mic...

Modular atomic force microscope with environmental controls

Multiple frequency atomic force microscopy

Nanoindenter

Transducer assembly with digitally created signals

Fully digitally controller for cantilever-based instruments

Active damping of high speed scanning probe microscope components

Patents Applicationslast 30 patents

Metrological Scanning Probe Microscope

Material Property Measurements Using Multiple Frequency Atomic Forc...

AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY

Metrological Scanning Probe Microscope

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

Fully Digitally Controller for Cantilever-Based Instruments

Modular Atomic Force Microscope

Modular Atomic Force Microscope with Environmental Controls

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Integrated Micro Actuator and LVDT for High Precision Position Meas...

Automated Atomic Force Microscope and the Operation Thereof

Optical Beam Positioning Unit for Atomic Force Microscope

QUANTITATIVE MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MIC...

Material Property Measurements Using Multiple Frequency Atomic Forc...

Metrological Scanning Probe Microscope

Variable Density Scanning

Modular Atomic Force Microscope with Environmental Controls

AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy

Automated Atomic Force Microscope and the Operation Thereof

Modular atomic force microscope with environmental controls

Fully Digitally Controller for Cantilever-Based Instruments

Variable Density Scanning

Thermal Measurements Using Multiple Frequency Atomic Force Microscopy

OPTICAL BEAM POSITIONING UNIT FOR ATOMIC FORCE MICROSCOPE

Modular Atomic Force Microscope

Material Property Measurements Using Multiple Frequency Atomic Fore...

Multiple Frequency Atomic Force Microscopy

Integrated Micro Actuator and LVDT for High Precision Position Meas...

Quantitative measurements using multiple frequency atomic force mic...